Published July 15, 1992 | Version v1
Journal article Metadata-only

The influence of transport processes on dE/dx fluctuations

Creators

  • 1. Lab. of Elementary Particles, Lebedev Physical Inst., Moscow (Russia)

Description

A general expression for ionization energy loss distribution produced by a relativistic charged particle in a thin absorber with correction for the influence of a transport process of the ionization electrons was obtained. The theory predictions are compared with Monte Carlo simulation. Some applications of the theory are discussed. (orig.)

Additional details

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A
Journal Volume
317
Journal Issue
3
Series
Nucl. Instrum. Methods Phys. Res., Sect. A.
Journal Page Range
601-603
ISSN
0168-9002
CODEN
NIMAE

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
23088697
Subject category
S73: NUCLEAR PHYSICS AND RADIATION PHYSICS;
Descriptors DEI
CHARGED-PARTICLE TRANSPORT; DIFFUSION; ELECTRON-ATOM COLLISIONS; ELECTRONS; ENERGY LOSSES; FLUCTUATIONS; IONIZATION; RELATIVISTIC RANGE; XENON; XENON IONS
Descriptors DEC
ATOM COLLISIONS; CHARGED PARTICLES; COLLISIONS; ELECTRON COLLISIONS; ELEMENTARY PARTICLES; ELEMENTS; ENERGY RANGE; FERMIONS; IONS; LEPTONS; NONMETALS; RADIATION TRANSPORT; RARE GASES; VARIATIONS

Optional Information

Notes
Letter-to-the-editor.