Published May 1, 2005 | Version v1
Journal article

XAFS spectroscopy of the mixed valent Sm1-xYxS

  • 1. RRC Kurchatov Institute, 123182 Moscow (Russian Federation)
  • 2. Moscow Engineering Physics Institute (State University), Kashirskoe shosse 31, 115409 Moscow (Russian Federation)
  • 3. Ioffe Physico-technical Institute, 194021 St Petersburg (Russian Federation)
  • 4. HASYLAB, DESY, 22603 Hamburg (Germany)

Description

X-ray absorption spectrum of the Sm L3 edge have been measured in the intermediate valence Sm1-xYxS for two dopant concentrations x=0.33 and 0.45. From the analysis of near-edge structure using the method that takes into consideration multiple scattering effects we managed to specify Sm valence value more precisely in wide temperature interval. Sm local crystalline structure was analyzed by EXAFS-spectroscopy; Sm-S coordination sphere parameters were obtained

Additional details

Identifiers

DOI
10.1016/j.nima.2005.01.182;
PII
S0168-9002(05)00282-2;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
543
Journal Issue
1
Journal Page Range
p. 205-207
ISSN
0168-9002
CODEN
NIMAER

Conference

Title
15. international synchrotron radiation conference
Acronym
SR 2004
Dates
19-23 Jul 2004
Place
Novosibirsk (Russian Federation)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
37033711
Subject category
S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ABSORPTION SPECTRA; ABSORPTION SPECTROSCOPY; FINE STRUCTURE; MULTIPLE SCATTERING; VALENCE; X RADIATION; X-RAY SPECTROSCOPY
Descriptors DEC
ELECTROMAGNETIC RADIATION; IONIZING RADIATIONS; RADIATIONS; SCATTERING; SPECTRA; SPECTROSCOPY

Optional Information

Copyright
Copyright (c) 2005 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.