Optical manipulation of temperature formation of CuInSe2 thin films
- 1. Faculty of Science, Physics Department, Minia University, Minia (Egypt)
- 2. Faculty of Science, Physics Department, Helwan University, Helwan (Egypt)
Description
Polycrystalline thin films of CuInSe2 were grown onto glass substrates using the stacked elemental layer (SEL) technique involving the annealing at different temperatures in air atmosphere for different times. The variation in the structure and optical properties of the CuInSe2 thin films on the annealing temperature and time was investigated using X-ray diffraction (XRD) and optical measurements, respectively. The different structural properties were clearly reflected in X-ray diffraction studies. It was concluded that CuInSe2 phase is dominated at annealing temperature of 300 deg. C for a time ≥1 h. Ternary phase of CuInSe2 was characterized by highly both transmission and absorption, optimization of the optical constants and band gap. Optical absorption studies indicate a direct band gap range around 1.0 eV. The data on structural and optical properties covering this technique will be presented
Additional details
Identifiers
- DOI
- 10.1016/j.mseb.2006.07.028;
- PII
- S0921-5107(06)00435-1;
Publishing Information
- Journal Title
- Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
- Journal Volume
- 134
- Journal Issue
- 1
- Journal Page Range
- p. 63-67
- ISSN
- 0921-5107
- CODEN
- MSBTEK
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38084662
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ANNEALING; CERIUM ALLOYS; COPPER ALLOYS; GLASS; INDIUM ALLOYS; LAYERS; OPTICAL PROPERTIES; OPTIMIZATION; POLYCRYSTALS; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION
- Descriptors DEC
- ALLOYS; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; FILMS; HEAT TREATMENTS; PHYSICAL PROPERTIES; RARE EARTH ALLOYS; SCATTERING; TRANSITION ELEMENT ALLOYS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.