Published September 25, 2006 | Version v1
Journal article

Optical manipulation of temperature formation of CuInSe2 thin films

  • 1. Faculty of Science, Physics Department, Minia University, Minia (Egypt)
  • 2. Faculty of Science, Physics Department, Helwan University, Helwan (Egypt)

Description

Polycrystalline thin films of CuInSe2 were grown onto glass substrates using the stacked elemental layer (SEL) technique involving the annealing at different temperatures in air atmosphere for different times. The variation in the structure and optical properties of the CuInSe2 thin films on the annealing temperature and time was investigated using X-ray diffraction (XRD) and optical measurements, respectively. The different structural properties were clearly reflected in X-ray diffraction studies. It was concluded that CuInSe2 phase is dominated at annealing temperature of 300 deg. C for a time ≥1 h. Ternary phase of CuInSe2 was characterized by highly both transmission and absorption, optimization of the optical constants and band gap. Optical absorption studies indicate a direct band gap range around 1.0 eV. The data on structural and optical properties covering this technique will be presented

Additional details

Identifiers

DOI
10.1016/j.mseb.2006.07.028;
PII
S0921-5107(06)00435-1;

Publishing Information

Journal Title
Materials Science and Engineering. B, Solid-State Materials for Advanced Technology
Journal Volume
134
Journal Issue
1
Journal Page Range
p. 63-67
ISSN
0921-5107
CODEN
MSBTEK

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38084662
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ANNEALING; CERIUM ALLOYS; COPPER ALLOYS; GLASS; INDIUM ALLOYS; LAYERS; OPTICAL PROPERTIES; OPTIMIZATION; POLYCRYSTALS; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION
Descriptors DEC
ALLOYS; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; FILMS; HEAT TREATMENTS; PHYSICAL PROPERTIES; RARE EARTH ALLOYS; SCATTERING; TRANSITION ELEMENT ALLOYS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.