Published July 1, 1987 | Version v1
Journal article

Resonance broadening and shifting of spectral lines in xenon and krypton

  • 1. Chemical Physics Section, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6378

Description

Three-photon excitation and multiphoton ionization techniques have been used to measure self-broadening for several resonance lines in xenon and krypton. Tabulations of widths and shifts of the xenon lines at 146.9, 129.6, 119.2, and 117.0 nm were made for pressures between 50 and 900 Torr. Similar measurements were made for the krypton resonance line at 116.5 nm. For pressures less than 500 Torr the widths were found to be in reasonable agreement with theoretical results, which were extrapolated into regions of concentration where the criteria for their validity are at best questionable. We have also found the lines to be shifted to the high-energy side of the unperturbed line. For four of the five lines studied, the blue shifts increased nearly linearly with increasing pressure. In the four cases where the shift could be measured the ratio of shift to width was close to (1/2. Our experimental technique is very simple, but it has yielded what we believe to be the first resonance broadening data based on absorption under conditions where there is strong trapping of the resonance radiation

Additional details

Publishing Information

Journal Title
Phys. Rev., A
Journal Volume
36
Journal Issue
1
Series
Phys. Rev., A.
Journal Page Range
81-89
ISSN
0556-2791
CODEN
PLRAA

INIS

Country of Publication
United States
Country of Input or Organization
United States
INIS RN
19014792
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Descriptors DEI
EMISSION SPECTRA; EXCITATION; IONIZATION; KRYPTON; LINE BROADENING; MULTI-PHOTON PROCESSES; PHOTOIONIZATION; PRESSURE DEPENDENCE; RESONANCE; SPECTRAL SHIFT; XENON
Descriptors DEC
ELEMENTS; ENERGY-LEVEL TRANSITIONS; NONMETALS; RARE GASES; SPECTRA