Effect of cascade localization induced bias effect and fluctuation of point defect reactions on defect structure evolution near planar sinks

Defect structure developments near planar sinks are analyzed as a competition of two effects. One is the cascade localization induced bias (CLIB) effect which leads vacancy-dominant point defect reactions during cascade damages. The other is a stochastic fluctuation effect of point defect reactions between defect clusters and freely migrating point defects. The sink geometry plays an important role in these effects. The strength of the two effects as a function of the distance to planar sinks is analyzed and the existence of a vacancy predominant volume near the sink is confirmed. The comparison is made between the analysis and experimental results. ((orig.))