Aspects of point defects energetics and diffusion in SiO2 from first principles simulations
- 1. Service de Recherches de Metallurgie Physique, CEA-Saclay, 91191 Gif sur Yvette (France)
Description
Diffusion properties are crucial for the simulation of post-irradiation evolution of materials and the structural and energetic peculiarities of point defects themselves should help us to understand the behavior of silica glasses under irradiation. Starting from a systematic first principles study of native point defects formation and migration energies in crystalline and amorphous silicon dioxide, we discuss the influence of the electron chemical potential and charge compensation on the dominant species contributing to oxygen self-diffusion in closed mode. We present then some results concerning the interaction of hydrogen impurities with oxygen interstitials in quartz and show that hydrogen passivation of oxygen interstitials is expected to occur; the consequences for oxygen self-diffusion cannot be overlooked
Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2006.04.159;
- PII
- S0168-583X(06)00563-5;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 250
- Journal Issue
- 1-2
- Journal Page Range
- p. 54-56
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 13. international conference on radiation effects in insulators
- Acronym
- REI-2005
- Dates
- 28 Aug - 2 Sep 2005
- Place
- Santa Fe, NM (United States)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 38038340
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- DEFECTS; ELECTRONS; GLASS; HYDROGEN; INTERSTITIALS; IRRADIATION; OXYGEN; PASSIVATION; PHYSICAL RADIATION EFFECTS; QUARTZ; SELF-DIFFUSION; SILICA; SILICON OXIDES; SIMULATION
- Descriptors DEC
- CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFUSION; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LEPTONS; MINERALS; NONMETALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; POINT DEFECTS; RADIATION EFFECTS; SILICON COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.