Published September 2006 | Version v1
Journal article

Aspects of point defects energetics and diffusion in SiO2 from first principles simulations

  • 1. Service de Recherches de Metallurgie Physique, CEA-Saclay, 91191 Gif sur Yvette (France)

Description

Diffusion properties are crucial for the simulation of post-irradiation evolution of materials and the structural and energetic peculiarities of point defects themselves should help us to understand the behavior of silica glasses under irradiation. Starting from a systematic first principles study of native point defects formation and migration energies in crystalline and amorphous silicon dioxide, we discuss the influence of the electron chemical potential and charge compensation on the dominant species contributing to oxygen self-diffusion in closed mode. We present then some results concerning the interaction of hydrogen impurities with oxygen interstitials in quartz and show that hydrogen passivation of oxygen interstitials is expected to occur; the consequences for oxygen self-diffusion cannot be overlooked

Additional details

Identifiers

DOI
10.1016/j.nimb.2006.04.159;
PII
S0168-583X(06)00563-5;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
250
Journal Issue
1-2
Journal Page Range
p. 54-56
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
13. international conference on radiation effects in insulators
Acronym
REI-2005
Dates
28 Aug - 2 Sep 2005
Place
Santa Fe, NM (United States)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
38038340
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
DEFECTS; ELECTRONS; GLASS; HYDROGEN; INTERSTITIALS; IRRADIATION; OXYGEN; PASSIVATION; PHYSICAL RADIATION EFFECTS; QUARTZ; SELF-DIFFUSION; SILICA; SILICON OXIDES; SIMULATION
Descriptors DEC
CHALCOGENIDES; CRYSTAL DEFECTS; CRYSTAL STRUCTURE; DIFFUSION; ELEMENTARY PARTICLES; ELEMENTS; FERMIONS; LEPTONS; MINERALS; NONMETALS; OXIDE MINERALS; OXIDES; OXYGEN COMPOUNDS; POINT DEFECTS; RADIATION EFFECTS; SILICON COMPOUNDS

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.