Published November 27, 2000 | Version v1
Journal article

Effects of intensity and position modulation on switched electrode electronics beam position monitor systems at Jefferson Lab

Creators

  • 1. Thomas Jefferson National Accelerator Facility, Newport News, Virginia (United States)

Description

Two types of switched electrode electronics beam position monitors are in use at Jefferson Lab. Together they provide accurate beam position to the control system for beam intensities between 50 nA and 2 mA. One version, called the linac style, has a switching frequency of 125 kHz. The other, called the transport type, has a switching frequency of 7 kHz. The basic system provides information to the control system at a 1 Hz update rate. The systems are regularly used to measure the AC component of beam position and energy as well as suppress this motion as part of a fast feedback system. Position data produced by the system are also acquired on an event by event basis as part of the nuclear physics program in two of the experimental halls. This paper will focus on the AC characteristics of the system. These characteristics are affected by analog filter frequencies and a time delay between the measurement of the positive electrode signal and the negative electrode signal. The errors introduced by position and intensity modulation on the measured beam characteristics will also be discussed

Additional details

Identifiers

Publishing Information

Journal Title
AIP Conference Proceedings
Journal Volume
546
Journal Issue
1
Journal Page Range
p. 541-546
ISSN
0094-243X
CODEN
APCPCS

Conference

Title
9. beam instrumentation workshop
Dates
8-11 May 2000
Place
Cambridge, MA (United States)

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
35041362
Subject category
S43: PARTICLE ACCELERATORS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
AC SYSTEMS; ANALOG SYSTEMS; BEAM MONITORING; BEAM MONITORS; BEAM POSITION; ELECTRODES; ELECTRONIC EQUIPMENT; FREQUENCY MODULATION; SIGNAL CONDITIONING
Descriptors DEC
ENERGY SYSTEMS; EQUIPMENT; MEASURING INSTRUMENTS; MODULATION; MONITORING; MONITORS; POWER SYSTEMS

Optional Information

Notes
(c) 2000 American Institute of Physics.