Published December 2015 | Version v1
Journal article

Atomic scale study of CU clustering and pseudo-homogeneous Fe–Si nanocrystallization in soft magnetic FeSiNbB(CU) alloys

  • 1. Materials Chemistry, RWTH Aachen University, Kopernikusstr. 10, 52074 Aachen (Germany)
  • 2. Max-Planck-Institut für Eisenforschung GmbH, Max-Planck-Str. 1, 40237 Düsseldorf (Germany)
  • 3. Vacuumschmelze GmbH & Co. KG, Grüner Weg 37, 63450 Hanau (Germany)

Description

A local electrode atom probe has been employed to trace the onset of Cu clustering followed by their coarsening and subsequent growth upon rapid (10 s) annealing of an amorphous Fe73.5Si15.5Cu1Nb3B7 alloy. It has been found that the clustering of Cu atoms introduces heterogeneities in the amorphous matrix, leading to the formation of Fe rich regions which crystallizes pseudo-homogeneously into Fe–Si nanocrystals upon annealing. In this paper, we present the data treatment method that allows for the visualization of these different phases and to understand their morphology while still quantifying them in terms of their size, number density and volume fraction. The crystallite size of Fe–Si nanocrystals as estimated from the atom probe data are found to be in good agreement with other complementary techniques like XRD and TEM, emphasizing the importance of this approach towards accurate structural analysis. In addition, a composition driven data segmentation approach has been attempted to determine and distinguish nanocrystalline regions from the remaining amorphous matrix. Such an analysis introduces the possibility of retrieving crystallographic information from extremely fine (2–4 nm sized) nanocrystalline regions of very low volume fraction (< 5 Vol%) thereby providing crucial in-sights into the chemical heterogeneity induced crystallization process of amorphous materials.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2015.04.006

Additional details

Identifiers

DOI
10.1016/j.ultramic.2015.04.006;
PII
S0304-3991(15)00076-5;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
159
Journal Issue
Part 2
Journal Page Range
p. 285-291
ISSN
0304-3991
CODEN
ULTRD6

Conference

Title
1. international conference on atom probe tomography and microscopy
Dates
31 Aug - 5 Sep 2014
Place
Stuttgart (Germany)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
48018119
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALLOYS; ANNEALING; ATOMS; CRYSTALLIZATION; CRYSTALLOGRAPHY; CRYSTALS; MICROSTRUCTURE; MORPHOLOGY; NANOSTRUCTURES; PROBES; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; DIFFRACTION; ELECTRON MICROSCOPY; HEAT TREATMENTS; MICROSCOPY; PHASE TRANSFORMATIONS; SCATTERING

Optional Information

Copyright
Copyright (c) 2015 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.