Published July 15, 2013
| Version v1
Journal article
Deposition of CrSiN/AlTiSiN nano-multilayer coatings by multi-arc ion plating using gas source silicon
Creators
- 1. Key Laboratory of Artificial Nanomaterials and Nanostructure of Ministry of Education, School of Physics and Technology, Wuhan University, 430072 Wuhan (China)
- 2. School of Power and Mechanical Engineering, Wuhan University, 430072 Wuhan (China)
Description
Quinary CrAlTiSiN coatings have been prepared on cemented carbide and Si substrates using Cr and AlTi (67:33 at.%) alloy targets in the mixture flow of N2 and SiH4 gas by multi-arc ion plating method. X-ray diffraction and transmission electron microscopy revealed that the multi-element coatings had a nc-CrSiN/nc-AlTiSiN multilayered structure with a thickness period of 10 nm. The microhardness and wear of the coatings were found to be strongly influenced by SiH4 flow rate. The hardness increased monotonically with the increase of SiH4 flow rate and reached 37 GPa at 23 sccm. The coatings exhibit friction coefficients varying between 0.58 and 0.76 against Si3N4 ball
Availability note (English)
Available from http://dx.doi.org/10.1016/j.nimb.2013.01.084Additional details
Identifiers
- DOI
- 10.1016/j.nimb.2013.01.084;
- PII
- S0168-583X(13)00332-7;
Publishing Information
- Journal Title
- Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
- Journal Volume
- 307
- Journal Page Range
- p. 143-146
- ISSN
- 0168-583X
- CODEN
- NIMBEU
Conference
- Title
- 18. international conference on ion beam modifications of materials
- Acronym
- IBMM2012
- Dates
- 2-7 Sep 2012
- Place
- Qingdao (China)
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 45065247
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ALLOYS; CERMETS; COATINGS; FRICTION FACTOR; LAYERS; MICROHARDNESS; PLATING; PRESSURE RANGE GIGA PA; SILANES; SILICON; SILICON NITRIDES; SUBSTRATES; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; COMPOSITE MATERIALS; DEPOSITION; DIFFRACTION; DIMENSIONLESS NUMBERS; DIMENSIONS; ELECTRON MICROSCOPY; ELEMENTS; HARDNESS; HYDRIDES; HYDROGEN COMPOUNDS; MATERIALS; MECHANICAL PROPERTIES; MICROSCOPY; NITRIDES; NITROGEN COMPOUNDS; ORGANIC COMPOUNDS; ORGANIC SILICON COMPOUNDS; PNICTIDES; PRESSURE RANGE; SCATTERING; SEMIMETALS; SILICON COMPOUNDS; SURFACE COATING
Optional Information
- Copyright
- Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.