Published August 15, 2011 | Version v1
Journal article

Thermal shock induced nanocrack as high efficiency surface conduction electron emitter

  • 1. State Key Laboratory for Manufacturing Systems Engineering, Xi'an Jiaotong University, Xi'an 710049 (China)
  • 2. Institute of Applied Mechanics, Zhejiang University, Hangzhou 310027 (China)

Description

Significant emission current enhancement has been achieved for surface conduction electron emitter, due to the special three-dimensional nanocrack structure fabricated by the thermal shock process. The three-dimensional configuration strongly changed the electric field distribution and controlled the emission electron trajectory. Thermal shock treatment was also used to increase the edge roughness of the nanocrack and thereby dramatically improved the field emission characteristics. Stable and uniform electron emission was observed with turn-on voltage of 150 V. The surface conduction current of 400 μA for 6 cells was obtained with the detector voltage of 1 kV and the gap voltage of 170 V.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.apsusc.2011.05.111

Additional details

Identifiers

DOI
10.1016/j.apsusc.2011.05.111;
PII
S0169-4332(11)00823-3;

Publishing Information

Journal Title
Applied Surface Science
Journal Volume
257
Journal Issue
21
Journal Page Range
p. 9125-9128
ISSN
0169-4332
CODEN
ASUSEE

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44025174
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
DISTRIBUTION; EFFICIENCY; ELECTRIC FIELDS; ELECTRON EMISSION; ELECTRONS; FIELD EMISSION; ROUGHNESS; SENSORS; SURFACES; THERMAL SHOCK
Descriptors DEC
ELEMENTARY PARTICLES; EMISSION; FERMIONS; LEPTONS; SURFACE PROPERTIES

Optional Information

Copyright
Copyright (c) 2011 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.