Morphology and magnetic properties of island-like Co and Ni films obtained by de-wetting
Creators
- 1. INRIM, Electromagnetism Division (Italy)
- 2. Politecnico di Torino, DISMIC and DIFIS (Italy)
- 3. Italian Institute of Technology—IIT-POLITO, Center for Space Human Robotics (Italy)
Description
The morphological, structural, and magnetic properties of Co and Ni films of different thicknesses grown by RF sputtering on a Si–SiO substrate and submitted to controlled diffusion of atoms on the substrate (de-wetting) are studied through X-ray diffraction (XRD), atomic force microscopy, X-ray photoelectron spectroscopy, and alternating-gradient magnetometry. For both metals, de-wetting treatment leads to the growth of non-percolating, metallic nanoislands characterized by a distribution of sizes and aspect ratios. XRD spectra reveal a polycrystalline multi-component structure evolving by effect of de-wetting and directly affecting the magnetic properties of films. The magnetic response after de-wetting is consistent with the formation of a nanogranular magnetic phase characterized by a complex, thickness-dependent magnetic behavior originating from the simultaneous presence of superparamagnetic and blocked-particle contributions. At intermediate film thickness (around 10 nm), a notable enhancement in magnetic coercivity is observed for both metals with respect to the values measured in precursor films and in their bulk counterparts.
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Nanoparticle Research
- Journal Volume
- 13
- Journal Issue
- 1
- Journal Page Range
- p. 245-255
- ISSN
- 1388-0764
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 43082845
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ASPECT RATIO; ATOMIC FORCE MICROSCOPY; FILMS; MAGNETIC PROPERTIES; MORPHOLOGY; NANOSTRUCTURES; PARTICLES; POLYCRYSTALS; SILICON OXIDES; SPECTRA; SPUTTERING; SUBSTRATES; SUPERPARAMAGNETISM; THICKNESS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; DIMENSIONLESS NUMBERS; DIMENSIONS; ELECTRON SPECTROSCOPY; MAGNETISM; MICROSCOPY; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SCATTERING; SILICON COMPOUNDS; SPECTROSCOPY
Optional Information
- Copyright
- Copyright (c) 2011 Springer Science+Business Media B.V.