Analysis of slip propagtion across grain boundaries using TEM, anisotropic elasticity, and FEM techniques
- 1. Dept. of Metallurgical Engineering, The Ohio State Univ., Columbus, OH (USA)
Description
The quantitative TEM characterization of lattice dislocation pile-ups at grain boundaries in polycrystalline materials can provide detailed information about the crystallography and mechanisms of slip transmission across a particular interface. This is used as input data in anisotropic elastic calculations of the local stress field and forces on both sides of the interface, and gives pile-up obstacle stresses varying from 280 to 870 MPa for different boundaries in the same type 304 stainless steel sample. These calculations have also led to an improved criterion for predicting slip systems activated across an interface; a double-ended pile-up interacting with two different boundaries is used as an illustration. In addition, dynamic in situ straining experiments in the HVEM reveal mechanisms for dislocation generation not predicted from static TEM studies. Finite element modeling (FEM) is also being used to predict the complete stress and state of specially oriented bicrystals
Additional details
Publishing Information
- Publisher
- Materials Research Society.
- Imprint Place
- Pittsburgh, PA (USA)
- ISBN
- 0-931837-92-8
- Imprint Title
- Interfacial structure, properties and design
- Imprint Pagination
- 609 p.
- Series
- Materials Research Society symposium proceedings. Volume 122.
- Journal Page Range
- p. 299-304.
Conference
- Title
- Interfacial structure, properties and designs in solids.
- Dates
- 5-9 Apr 1988.
- Place
- Reno, NV (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 21052331
- Subject category
- S36: MATERIALS SCIENCE; S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ANISOTROPY; CRACK PROPAGATION; CRYSTAL LATTICES; CRYSTALLOGRAPHY; DISLOCATION PINNING; FINITE ELEMENT METHOD; GRAIN BOUNDARIES; LATTICE PARAMETERS; POLYCRYSTALS; STAINLESS STEELS; TRANSMISSION ELECTRON MICROSCO
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; CRYSTAL STRUCTURE; CRYSTALS; ELECTRON MICROSCOPY; HIGH ALLOY STEELS; IRON ALLOYS; IRON BASE ALLOYS; MICROSCOPY; MICROSTRUCTURE; NUMERICAL SOLUTION; STEELS
Optional Information
- Secondary number(s)
- CONF-8804112--.