Published March 1, 2005 | Version v1
Journal article

Monitoring simultaneously the growth of nanoparticles and aggregates by in situ ultra-small-angle x-ray scattering

  • 1. UNICAT, Advanced Photon Source, Building 438D, 9700 South Cass Avenue, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
  • 2. Department of Chemical and Materials Engineering, University of Cincinnati, 540 Engineering Research Center, Cincinnati, Ohio 45221-0012 (United States)
  • 3. Particle Technology Laboratory, Department of Mechanical and Process Engineering, ETH Zurich, ML F23, CH-8092 Zurich (Switzerland)

Description

Ultra-small-angle x-ray scattering can provide information about primary particles and aggregates from a single scattering experiment. This technique is applied in situ to flame aerosol reactors for monitoring simultaneously the primary particle and aggregate growth dynamics of oxide nanoparticles in a flame. This was enabled through the use of a third generation synchrotron source (Advanced Photon Source, Argonne IL, USA) using specialized scattering instrumentation at the UNICAT facility which is capable of simultaneously measuring nanoscales to microscales (1 nm to 1 μm). More specifically, the evolution of primary-particle diameter, mass-fractal dimension, geometric standard deviation, silica volume fraction, number concentration, radius of gyration of the aggregate, and number of primary particles per aggregate are measured along the flame axis for two different premixed flames. All these particle characteristics were derived from a single and nonintrusive measurement technique. Flame temperature profiles were measured in the presence of particles by in situ Fourier transform infrared spectroscopy and thermophoretic sampling was used to visualize particle growth with height above the burner as well as in the radial direction

Additional details

Identifiers

Publishing Information

Journal Title
Journal of Applied Physics
Journal Volume
97
Journal Issue
5
Journal Page Range
p. 054309-054309.11
ISSN
0021-8979
CODEN
JAPIAU

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
36106930
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
AEROSOLS; CRYSTAL GROWTH; FOURIER TRANSFORM SPECTROMETERS; INFRARED SPECTRA; NANOSTRUCTURES; SILICA; SILICON COMPOUNDS; SMALL ANGLE SCATTERING; X-RAY DIFFRACTION
Descriptors DEC
COHERENT SCATTERING; COLLOIDS; DIFFRACTION; DISPERSIONS; MEASURING INSTRUMENTS; MINERALS; OXIDE MINERALS; SCATTERING; SOLS; SPECTRA; SPECTROMETERS

Optional Information

Notes
(c) 2005 American Institute of Physics