Published March 15, 2007
| Version v1
Journal article
Simplified description of microwave plasma discharge for chemical vapor deposition of diamond
- 1. Diamond Research Center, National Institute of Advanced Industrial Science and Technology (AIST), Japan, Midorigaoka 1-8-31, Ikeda, Osaka 563-8577 (Japan)
Description
A fluid model to prescribe microwave plasma is proposed. The conservation equations for electron are reduced to only one differential equation. Therefore, the computational cost is also reduced as small as possible. One may extend functions of existing program for vacuum field analysis to microwave plasma simulator by coupling this differential equation with Maxwell equations. While the model is quite simple, this model can prescribe distributions of electron temperature as well as the number density, whereas effects of inelastic collisions with ions and neutrals are taken into account. Test calculation is carried out in three dimensional system and well reproduces experimental observation and prediction obtained by other model
Additional details
Identifiers
- DOI
- 10.1063/1.2711811;
Publishing Information
- Journal Title
- Journal of Applied Physics
- Journal Volume
- 101
- Journal Issue
- 6
- Journal Page Range
- p. 063302-063302.6
- ISSN
- 0021-8979
- CODEN
- JAPIAU
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 39011498
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY;
- Descriptors DEI
- CHEMICAL VAPOR DEPOSITION; DIAMONDS; ELECTRON TEMPERATURE; HIGH-FREQUENCY DISCHARGES; ION TEMPERATURE; MAXWELL EQUATIONS; MICROWAVE RADIATION; PLASMA; PLASMA DENSITY; PLASMA SIMULATION; SIMULATORS; THREE-DIMENSIONAL CALCULATIONS
- Descriptors DEC
- ANALOG SYSTEMS; CARBON; CHEMICAL COATING; DEPOSITION; DIFFERENTIAL EQUATIONS; ELECTRIC DISCHARGES; ELECTROMAGNETIC RADIATION; ELEMENTS; EQUATIONS; FUNCTIONAL MODELS; MINERALS; NONMETALS; PARTIAL DIFFERENTIAL EQUATIONS; RADIATIONS; SIMULATION; SURFACE COATING
Optional Information
- Notes
- (c) 2007 American Institute of Physics