Fundamental study of plasma etching physico-chemical mechanisms based on steric effects and diffusion - Forecasted behaviors of the etching of the elements in the group IV and III-V compounds by the halogens: laws of similarity
Description
The objective of this work is the generalization of the modeling of the etching of silicon in fluorine or chlorine plasmas to that of the etching of the elements in column IV and of III-V compounds with diamond-like or zinc-blend crystal structure in halogen plasmas (i.e. fluorine, chlorine, bromine and iodine). In this context, steric effects and volume and/or surface diffusion are the main issues. This generalization is based on the etching model of Petit and Pelletier which, compared to previous models, takes into account a number of separate or additional assumptions such as the repulsive interactions between halogen adatoms in nearest neighbor positions, the Langmuir- Hinshelwood mechanisms for the formation of reaction products, the mono-layer or multi-layer nature of the adsorption, and the diffusion of adatoms on the surface. Steric effects related to the diffusion of halogens through the (100) surfaces of the crystal structures of the elements of column IV and III-V compounds define a first law of similarity between the crystal lattice and the Shannon ionic radius of the halogen atoms concerning their bulk diffusion conditions. This law results in a forecast diagram, common to column IV elements and III-V compounds, delimiting the mono-layer or multi-layer type of the etching systems. Steric effects related to the reaction mechanisms of etching on (100) surfaces lead to the second laws of similarity between the crystal lattice and the covalent radius of halogen adatoms characterizing the etching behavior: isotropic etching, anisotropic etching or no etching. These laws of similarity, distinct between the elements of the column IV and III-V compounds (different stoichiometry of the reaction products), result in two forecast diagrams delimiting the distinct etching domains. Forecast diagrams for column IV elements have been validated, first, from previous experimental results, and, secondly, in the absence of data, from additional experimental studies: etching of Si and Ge in bromine and iodine plasmas, and etching of Sn in iodine plasmas. (author)
Abstract (French)
L'objectif de ce travail porte sur la generalisation de la modelisation de la gravure du silicium dans les plasmas de fluor ou de chlore a celle de la gravure des elements de la colonne IV et des composes III-V de structure cristalline de type diamant ou zinc-blende dans les plasmas d'halogenes, i.e. fluor, chlore, brome et iode. Dans ce contexte, les effets steriques et de diffusion en volume et/ou en surface en constituent les problematiques principales. Cette generalisation s'appuie sur le modele de gravure de Petit et Pelletier qui, par rapport aux modeles anterieurs, prend en compte un certain nombre d'hypotheses distinctes ou additionnelles telles que les interactions repulsives entre adatomes d'halogenes proches voisins, les mecanismes de Langmuir-Hinshelwood pour la formation des produits de reaction, la nature mono-couche ou multi-couches de l'adsorption, et la diffusion des adatomes en surface. Les effets steriques relatifs a la diffusion des atomes d'halogenes a travers les surfaces (100) des structures cristallines des elements de la colonne IV et des composes III-V definissent une premiere loi de similitude entre la maille du reseau cristallin et le rayon ionique de Shannon des atomes d'halogenes concernant leurs conditions de diffusion en volume. Cette loi se traduit par un diagramme previsionnel, commun aux elements de la colonne IV et aux composes III-V, delimitant les systemes de gravure de types mono-couche et multi-couches. Les effets steriques relatifs aux mecanismes reactionnels de gravure sur les surfaces (100) aboutissent a des secondes lois de similitude entre la maille du reseau et le rayon covalent des adatomes d'halogenes caracterisant la nature de la gravure: gravure isotrope, gravure anisotrope, ou absence de gravure. Ces lois de similitude, distinctes pour les elements de la colonne IV et les composes III-V (stoechiometrie differente des produits de reaction), se traduisent par deux diagrammes previsionnels delimitant les differents domaines de gravure. Les diagrammes previsionnels pour les elements de la colonne IV ont pu etre valides, d'une part, a partir des resultats experimentaux anterieurs, et, d'autre part, en l'absence de donnees, a partir d'etudes experimentales complementaires: gravure de Si et Ge en plasma de brome et d'iode, gravure de Sn en plasma d'iode. (auteur)
Files
Additional details
Additional titles
- Original title (French)
- Etude fondamentale des mecanismes physico-chimiques de gravure plasma bases sur les effets steriques et de diffusion. Comportements previsionnels de la gravure des elements de la colonne IV et des composes III-V par les halogenes: lois de similitude
Publishing Information
- Imprint Pagination
- 230 p.
- Report number
- FRNC-TH--13941
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 54027989
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Thesis
- Descriptors DEI
- ADSORPTION; ANISOTROPY; CHEMISORPTION; COMPUTERIZED SIMULATION; COVALENCE; DIFFUSION; ETCHING; FCC LATTICES; HALOGENS; MICROWAVE ION SOURCES; PLASMA; SILICON
- Descriptors DEC
- CHEMICAL REACTIONS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; CUBIC LATTICES; ELEMENTS; ION SOURCES; NONMETALS; PLASMA ION SOURCES; SEMIMETALS; SEPARATION PROCESSES; SIMULATION; SORPTION; SURFACE FINISHING; THREE-DIMENSIONAL LATTICES
Optional Information
- Notes
- 188 refs.; Available from the INIS Liaison Officer for France, see the INIS website for current contact and E-mail addresses