Analysis of adapter materials of the steam generator by NAA and EDXRF
Creators
- 1. Fuel Chemistry Division, Indira Gandhi Centre for Atomic Research, Kalpakkam (India)
- 2. Radiochemistry Division, Bhabha Atomic Research Centre, Mumbai (India)
Description
Broken pieces of nut and washer of an adapter material used in a thermal sensor guide tube for a steam generator and needed its replication for its replacement because of damage. The present paper discusses the analysis of the sample using neutron activation analysis (NAA) and Energy Dispersive X-ray Fluorescence (EDXRF). The samples with standards were irradiated in the PFTS position of the KAMINI reactor for 6 h at 20 kW and assayed the activated products using HPGe detector. The elemental composition was obtained by k0 based Internal Monostandard NAA (IM-NAA) and k0-NAA utilizing f and a values of the modified core. The relative underestimation of Fe and overestimation of Ni and Cr by ED-XRF needs further investigation including the clarity on the possible role of the absorption-enhancement and depletion, eventhough the possible preferential surface enrichment / depletion of the sample surface may be an unlikely event. Considering the overall results obtained, the adaptor material (nut and washer) is more likely to be SS316
Additional details
Publishing Information
- Publisher
- Bhabha Atomic Research Centre
- Imprint Place
- Mumbai (India)
- Imprint Title
- Proceedings of the fourteenth biennial DAE-BRNS symposium on nuclear and radiochemistry: book of abstracts
- Imprint Pagination
- 412 p.
- Journal Page Range
- p. 193
Conference
- Title
- 14. biennial DAE-BRNS symposium on nuclear and radiochemistry
- Acronym
- NUCAR-2019
- Dates
- 15-19 Jan 2019
- Place
- Mumbai (India)
INIS
- Country of Publication
- India
- Country of Input or Organization
- India
- INIS RN
- 50045917
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- FASTENERS; HIGH-PURITY GE DETECTORS; IRON; MOLYBDENUM; NEUTRON ACTIVATION ANALYSIS; QUANTITATIVE CHEMICAL ANALYSIS; TUNGSTEN; X-RAY FLUORESCENCE ANALYSIS
- Descriptors DEC
- ACTIVATION ANALYSIS; CHEMICAL ANALYSIS; ELEMENTS; GE SEMICONDUCTOR DETECTORS; MEASURING INSTRUMENTS; METALS; NONDESTRUCTIVE ANALYSIS; RADIATION DETECTORS; REFRACTORY METALS; SEMICONDUCTOR DETECTORS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS
Optional Information
- Notes
- 3 refs., 1 tab.