Published 1989 | Version v1
Miscellaneous Metadata-only

Interferometric effects in X-ray reflection section topographs

Creators

  • 1. AN SSSR, Leningrad (USSR). Fiziko-Tekhnicheskij Inst.

Description

Short note. 3 refs

Additional details

Publishing Information

Imprint Title
12. European crystallographic meeting. V. 3
Imprint Pagination
475 p.
Journal Page Range
p. 102.
Report number
INIS-SU--224(Vol.3)

Conference

Title
12. European crystallographic meeting.
Dates
20-29 Aug 1989.
Place
Moscow (USSR).

INIS

Country of Publication
USSR
Country of Input or Organization
USSR
INIS RN
22022268
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference, No Abstract
Descriptors DEI
ION IMPLANTATION; MEV RANGE 10-100; MONOCRYSTALS; OXYGEN IONS; RADIATION DOSES; SILICON; STRESSES; X-RAY DIFFRACTION
Descriptors DEC
CHARGED PARTICLES; COHERENT SCATTERING; CRYSTALS; DIFFRACTION; ELEMENTS; ENERGY RANGE; IONS; MEV RANGE; SCATTERING; SEMIMETALS