Published May 23, 2007 | Version v1
Journal article

Monochromatization of characteristic X-rays using stepped X-ray waveguide

  • 1. Institute for Materials Research, Tohoku University, Sendai 980-8577 (Japan)
  • 2. NTT Advanced Technology Corporation, Tokai-mura, Naka-gun 319-1106 (Japan)

Description

Depending on the X-ray energy, the structure of an X-ray waveguide needs to be varied for greater efficiency. Therefore, a Si/PMMA(polymethyl methacrylate)/Si thin-film structure, whose top Si layer was steplike, was designed as a planar X-ray waveguide on the basis of calculations, and it was fabricated by spin-coating and sputtering. By irradiating white X-rays on two selected areas of a stepped waveguide, the top-layer thicknesses of which were different, W Lβ and Mo Kα lines were effectively guided and monochromatized

Additional details

Identifiers

DOI
10.1016/j.tsf.2006.12.017;
PII
S0040-6090(06)01556-2;

Publishing Information

Journal Title
Thin Solid Films
Journal Volume
515
Journal Issue
14
Journal Page Range
p. 5728-5731
ISSN
0040-6090
CODEN
THSFAP

Conference

Title
9. International conference on surface X-ray and neutron scattering
Dates
16-20 Jul 2006
Place
Taipei, Taiwan (China)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39018832
Subject category
S36: MATERIALS SCIENCE;
Resource subtype / Literary indicator
Conference
Descriptors DEI
LAYERS; PMMA; REFLECTIVITY; SILICON; SPIN-ON COATING; SPUTTERING; THIN FILMS; WAVEGUIDES; X RADIATION
Descriptors DEC
DEPOSITION; ELECTROMAGNETIC RADIATION; ELEMENTS; ESTERS; FILMS; IONIZING RADIATIONS; OPTICAL PROPERTIES; ORGANIC COMPOUNDS; ORGANIC POLYMERS; PHYSICAL PROPERTIES; POLYACRYLATES; POLYMERS; POLYVINYLS; RADIATIONS; SEMIMETALS; SURFACE COATING; SURFACE PROPERTIES

Optional Information

Copyright
Copyright (c) 2007 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.