Published 2018 | Version v1
Miscellaneous Metadata-only

Accessing the Internal Morphology of Nano-Granular FEBID Materials in 3D Space by Electron Tomography

Creators

  • 1. Graz Centre for Electron Microscopy, Steyrergasse 17, 8010 Graz (Austria)
  • 2. Institute of Electron Microscopy and Nanoanalysis, Graz University of Technology, Steyrergasse 17, 8010 Graz (Austria)
  • 3. Christian Doppler Laboratory DEFINE – Graz University of Technology, Steyrergasse 17, 8010 Graz (Austria)

Description

no abstract available

Part of:
68th Annual Meeting of the Austrian Physical Society

Additional details

Additional titles

Original title (English)
68. Jahrestagung der Österreichischen Physikalischen Gesellschaft

Identifiers

URL
https://www.tugraz.at/events/oepg-2018/home/;

Publishing Information

Publisher
Institute of Experimental Physics, Graz University of Technology
Imprint Place
Graz (Austria)
Imprint Title
68th Annual Meeting of the Austrian Physical Society
Imprint Pagination
150 p.
Journal Page Range
p. 109-110

Conference

Title
68. Annual Meeting of the Austrian Physical Society
Original Conference Title
68. Jahrestagung der Österreichischen Physikalischen Gesellschaft
Dates
10-13 Sep 2018
Place
Graz (Austria)

INIS

Country of Publication
Austria
Country of Input or Organization
Austria
INIS RN
50044704
Subject category
S36: MATERIALS SCIENCE; S77: NANOSCIENCE AND NANOTECHNOLOGY; S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
No Abstract, Conference, Non-conventional Literature
Descriptors DEI
ATOMIC FORCE MICROSCOPY; CHEMISTRY; CRYSTAL GROWTH; DEPOSITION; ELECTRON BEAMS; ELECTRONS; FABRICATION; GRAIN SIZE; GRANULAR MATERIALS; IMAGES; MORPHOLOGY; NANOSTRUCTURES; ORGANOMETALLIC COMPOUNDS; RESONATORS; SPATIAL DISTRIBUTION; THREE-DIMENSIONAL LATTICES; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; TWO-DIMENSIONAL SYSTEMS; YOUNG MODULUS
Descriptors DEC
BEAMS; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIAGNOSTIC TECHNIQUES; DISTRIBUTION; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; ELEMENTARY PARTICLES; EQUIPMENT; FERMIONS; LEPTON BEAMS; LEPTONS; MATERIALS; MECHANICAL PROPERTIES; MICROSCOPY; MICROSTRUCTURE; ORGANIC COMPOUNDS; PARTICLE BEAMS; SIZE

Optional Information

Notes
Imprint:68. Jahrestagung der #Latin Capital Letter O With Diaeresis#sterreichischen Physikalischen Gesellschaft