A simple SQUID system with one operational amplifier as readout electronics
Creators
- 1. State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology (SIMIT), Chinese Academy of Sciences (CAS), 200050 Shanghai (China)
- 2. Peter Grünberg Institute (PGI-8), Forschungszentrum Jülich (FZJ), D-52425 Jülich (Germany)
Description
We describe a dc Superconducting Quantum Interference Device (SQUID) readout electronics in Flux Locked Loop (FLL) mode without integrator and with only one operational amplifier, which is called Single Chip Readout Electronics (SCRE). A weakly damped niobium-SQUID magnetometer with a large flux-to-voltage transfer coefficient of about ∂V/∂Φ ≈ 380 μV/Φ0 and SCRE results in a very simple SQUID system. We characterize the system and demonstrate its applicability to Magnetocardiography (MCG) and measurements using the Transient ElectroMagnetic (TEM) method. SCRE not only simplifies the readout scheme, but also improves the system stability, the bandwidth and the slew rate. The difference between SCRE and a conventional readout scheme (preamplifier + amplifier + integrator) is also discussed. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/0953-2048/27/11/115004Additional details
Identifiers
Publishing Information
- Journal Title
- Superconductor Science and Technology
- Journal Volume
- 27
- Journal Issue
- 11
- Journal Page Range
- [4 p.]
- ISSN
- 0953-2048
- CODEN
- SUSTEF
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 47036521
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Descriptors DEI
- ELECTRIC POTENTIAL; MAGNETIC FLUX; MAGNETOMETERS; NIOBIUM; OPERATIONAL AMPLIFIERS; READOUT SYSTEMS; SQUID DEVICES; TRANSIENTS; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- AMPLIFIERS; ELECTRON MICROSCOPY; ELECTRONIC EQUIPMENT; ELEMENTS; EQUIPMENT; FLUXMETERS; MEASURING INSTRUMENTS; METALS; MICROSCOPY; MICROWAVE EQUIPMENT; REFRACTORY METALS; SUPERCONDUCTING DEVICES; TRANSITION ELEMENTS