Published April 1996
| Version v1
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Particle contamination in vacuum systems
Creators
- 1. Paris-11 Univ., 91 - Orsay (France). Lab. pour l'Utilisation du Rayonnement Electromagnetique (LURE)
Description
Many vacuum devices, like RF cavities, are sensitive to particle contamination. This fact has motivated a considerable effort of cleanliness from the SRF community. The first results of a general study trying to identify the most contaminating steps during assembly and vacuum operation of the cavity is reported. The steps investigated here are gasket assembly, evacuation and venting of the vacuum system, and operation of sputter ion pumps. (author)
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28042587.pdf
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Additional details
Publishing Information
- Imprint Title
- Research and development on superconducting cavities. The Saclay contribution to the 7. Workshop on RF superconductivity
- Imprint Pagination
- [116 p.].
- Journal Page Range
- p. 41-45.
- Report number
- CEA-DAPNIA-SEA--96-05
Conference
- Title
- 7. Workshop on RF superconductivity.
- Dates
- 17-20 Oct 1995.
- Place
- Gif-sur-Yvette (France).
INIS
- Country of Publication
- France
- Country of Input or Organization
- France
- INIS RN
- 28042587
- Subject category
- S43: PARTICLE ACCELERATORS;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ACCELERATION; GASKETS; PARTICULATES; POLLUTION; RF SYSTEMS; SPUTTER-ION PUMPS; SUPERCONDUCTING CAVITY RESONATORS; SURFACE PROPERTIES; VACUUM SYSTEMS
- Descriptors DEC
- CAVITY RESONATORS; ELECTRONIC EQUIPMENT; EQUIPMENT; PARTICLES; PUMPS; RESONATORS; SEALS; SUPERCONDUCTING DEVICES; VACUUM PUMPS
Optional Information
- Notes
- 4 refs.