Published March 2013 | Version v1
Journal article

In situ broadband cryogenic calibration for two-port superconducting microwave resonators

  • 1. CNAM, Physics Department, University of Maryland, College Park, Maryland 20742-4111 (United States)
  • 2. Electrical and Computer Engineering Department, University of Maryland, College Park, Maryland 20742-3285 (United States)

Description

We introduce an improved microwave calibration method for use in a cryogenic environment, based on a traditional three-standard calibration, the Thru-Reflect-Line (TRL) calibration. The modified calibration method takes advantage of additional information from multiple measurements of an ensemble of realizations of a superconducting resonator, as a new pseudo-Open standard, to correct errors in the TRL calibration. We also demonstrate an experimental realization of this in situ broadband cryogenic calibration system utilizing cryogenic switches. All calibration measurements are done in the same thermal cycle as the measurement of the resonator (requiring only an additional 20 min), thus avoiding 4 additional thermal cycles for traditional TRL calibration (which would require an additional 12 days). The experimental measurements on a wave-chaotic microwave billiard verify that the new method significantly improves the measured scattering matrix of a high-quality-factor superconducting resonator.

Additional details

Identifiers

Publishing Information

Journal Title
Review of Scientific Instruments
Journal Volume
84
Journal Issue
3
Journal Page Range
p. 034706-034706.8
ISSN
0034-6748
CODEN
RSINAK

INIS

Country of Publication
United States
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
44063281
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S71: CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS;
Descriptors DEI
CALIBRATION; CALIBRATION STANDARDS; CRYOGENICS; MICROWAVE RADIATION; RESONATORS; S MATRIX
Descriptors DEC
ELECTROMAGNETIC RADIATION; ELECTRONIC EQUIPMENT; EQUIPMENT; MATRICES; RADIATIONS; STANDARDS

Optional Information

Notes
(c) 2013 American Institute of Physics