Monolithic CMOS front-end electronics with analog pipelining
Creators
- 1. CERN, CH-1211 Geneva 23 (Switzerland)
- 2. SSC Lab., Dallas (TX)
- 3. Getec AS, Oslo (Norway)
- 4. SI, Oslo (Norway)
Description
This paper reports on basic functional blocks designed and tested: Bipoltest, CSI, SAPE and PIPAD which are a front-end amplifier, a current sampling integrator, an analog pipeline and an analog/digital converter respectively. These functional blocks will eventually be combined in a single chip, and this processor will be the starting point for the HARP architecture. The signal amplifier peaking time for low capacitance detector elements is less than 15 ns. The sampling rate of the pipeline element in the 3 μm CMOS is measured to be 20 MHz with a dynamic range of ±1.2 pC of input charge which corresponds to 11 bits and the sampling rate in the 1.5 μm technology is over 60 MHz. The ADC operates at 1 MHz sampling rate with 12 mW for 11 bits precision
Additional details
Publishing Information
- Publisher
- IEEE Service Center.
- Imprint Place
- Piscataway, NJ (USA)
- Imprint Title
- IEEE nuclear science symposium conference record emdash 1990
- Imprint Pagination
- 1636 p.
- Journal Page Range
- p. 543-552.
Conference
- Title
- 1990 Institute of Electrical and Electronics Engineers (IEEE) nuclear science symposium.
- Dates
- 22-27 Oct 1990.
- Place
- Arlington, VA (USA).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 22091690
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference, Numerical Data
- Descriptors DEI
- ANALOG SYSTEMS; ANALOG-TO-DIGITAL CONVERTERS; CAPACITANCE; COMPUTER ARCHITECTURE; ELECTRONIC CIRCUITS; EXPERIMENTAL DATA; FUNCTIONAL ANALYSIS; NUMERICAL DATA; PERFORMANCE TESTING; PULSE INTEGRATORS; RADIATION DETECTORS; SIGNAL CONDITIONING; SPECIFICATIONS
- Descriptors DEC
- DATA; ELECTRICAL PROPERTIES; ELECTRONIC EQUIPMENT; EQUIPMENT; INFORMATION; MATHEMATICS; MEASURING INSTRUMENTS; PHYSICAL PROPERTIES; TESTING
Optional Information
- Secondary number(s)
- CONF-9010220--.