A new method for testing high resolution nuclear ADC's

The paper describes design of a system for testing of nuclear ADC 's based on new method. Unlike conventional testing methods which give only INL and DNL of ADC, using this method a channel profile of ADC can be obtained along with INL and DNL. The method utilizes two DACs one of which is used with scaled down output to reduce errors and is called calibrating DAC. The second DAC which is called as biasing DAC, is used to cover the full range of input. It is possible to find INL with errors less than 1 PPM FS. The entire test system can be constructed using commercially available low cost components with total component cost of less than $ 500. (author)