Published 2020 | Version v1
Miscellaneous

Development of the statistical methods for X-ray detector characterization to use in CT

  • 1. Tomsk Polytechnic Univ., Tomsk (Russian Federation)

Description

no abstract available

Part of:
VI International scientific conference of young scientists, postgraduates and students «Isotopes: technologies, materials and applications». Collection of theses

Additional details

Additional titles

Original title (English)
VI Mezhdunarodnaya nauchnaya konferentsiya molodykh uchenykh, aspirantov i studentov «Izotopy: tekhnologii, materialy i primenenie». Sbornik tezisov dokladov

Publishing Information

Publisher
TPU
Imprint Place
Tomsk (Russian Federation)
Imprint Title
VI International scientific conference of young scientists, postgraduates and students #Left-Pointing Double Angle Quotation Mark#Isotopes: technologies, materials and applications#Right-Pointing Double Angle Quotation Mark#. Collection of theses
Imprint Pagination
112 p.
Journal Page Range
p. 107-108
Report number
INIS-RU--622

Conference

Title
6. international scientific conference of young scientists, postgraduates and students on isotopes, technologies, materials and applications
Original Conference Title
VI Mezhdunarodnaya nauchnaya konferentsiya molodykh uchenykh, aspirantov i studentov «Izotopy: tekhnologii, materialy i primenenie»
Dates
26-29 Oct 2020
Place
Tomsk (Russian Federation)

INIS

Country of Publication
Russian Federation
Country of Input or Organization
Russian Federation
INIS RN
53057098
Subject category
S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
Resource subtype / Literary indicator
No Abstract, Conference
Descriptors DEI
CALCULATION METHODS; DIAGNOSTIC TECHNIQUES; PHOTON COUNTING; PHOTON TRANSPORT; TOMOGRAPHY; X-RAY DETECTION
Descriptors DEC
DETECTION; DIAGNOSTIC TECHNIQUES; NEUTRAL-PARTICLE TRANSPORT; RADIATION DETECTION; RADIATION TRANSPORT

Optional Information

Notes
1 ref. Imprint:VI Mezhdunarodnaya nauchnaya konferentsiya molodykh uchenykh, aspirantov i studentov #Left-Pointing Double Angle Quotation Mark#Izotopy: tekhnologii, materialy i primenenie#Right-Pointing Double Angle Quotation Mark#. Sbornik tezisov dokladov