Published April 25, 2011 | Version v1
Journal article

Structured scintillator for hard x-ray grating interferometry

  • 1. Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland)
  • 2. European Synchrotron Radiation Facility, F-38043 Grenoble (France)
  • 3. Scint-X AB, 16440 Kista-Stockholm (Sweden)
  • 4. Royal Institute of Technology, 16440 Kista-Stockholm (Sweden)

Description

Grating interferometry at conventional x-ray tubes improves the quality of radiographies and tomograms by providing phase and scattering contrast data. The main challenge encountered when applying this technique at high photon energies, as required by many applications to obtain sufficient penetration depth, is to maintain a high fringe visibility. In this letter, we report on a substantial improvement in fringe visibility and according improvements in image quality achieved by replacing the absorbing analyzer grating of the interferometer with a structured scintillator grating. This development represents a significant step toward the implementation of this technique in industrial testing and medical applications.

Additional details

Identifiers

Publishing Information

Journal Title
Applied Physics Letters
Journal Volume
98
Journal Issue
17
Journal Page Range
p. 171107-171107.3
ISSN
0003-6951
CODEN
APPLAB

Optional Information

Notes
(c) 2011 American Institute of Physics