Published April 25, 2011
| Version v1
Journal article
Structured scintillator for hard x-ray grating interferometry
Creators
- 1. Paul Scherrer Institut, CH-5232 Villigen PSI (Switzerland)
- 2. European Synchrotron Radiation Facility, F-38043 Grenoble (France)
- 3. Scint-X AB, 16440 Kista-Stockholm (Sweden)
- 4. Royal Institute of Technology, 16440 Kista-Stockholm (Sweden)
Description
Grating interferometry at conventional x-ray tubes improves the quality of radiographies and tomograms by providing phase and scattering contrast data. The main challenge encountered when applying this technique at high photon energies, as required by many applications to obtain sufficient penetration depth, is to maintain a high fringe visibility. In this letter, we report on a substantial improvement in fringe visibility and according improvements in image quality achieved by replacing the absorbing analyzer grating of the interferometer with a structured scintillator grating. This development represents a significant step toward the implementation of this technique in industrial testing and medical applications.
Additional details
Identifiers
- DOI
- 10.1063/1.3583464;
Publishing Information
- Journal Title
- Applied Physics Letters
- Journal Volume
- 98
- Journal Issue
- 17
- Journal Page Range
- p. 171107-171107.3
- ISSN
- 0003-6951
- CODEN
- APPLAB
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42109050
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Descriptors DEI
- DIFFRACTION GRATINGS; HARD X RADIATION; IMAGES; INTERFEROMETERS; INTERFEROMETRY; PENETRATION DEPTH; PHOSPHORS; PHOTONS; SCATTERING; X-RAY RADIOGRAPHY; X-RAY TUBES
- Descriptors DEC
- BOSONS; ELECTROMAGNETIC RADIATION; ELECTRON TUBES; ELEMENTARY PARTICLES; EQUIPMENT; INDUSTRIAL RADIOGRAPHY; IONIZING RADIATIONS; MASSLESS PARTICLES; MATERIALS TESTING; MEASURING INSTRUMENTS; NONDESTRUCTIVE TESTING; RADIATIONS; TESTING; X RADIATION; X-RAY EQUIPMENT
Optional Information
- Notes
- (c) 2011 American Institute of Physics