Investigation of phase contrast hard X-ray microscopy using planar sets of refractive crossed linear parabolic lenses made from SU-8 polymer
- 1. Institute for Microstructure Technology (IMT), Forschungszentrum Karlsruhe, Postfach 3640, 76021 Karlsruhe (Germany)
- 2. Institute for Synchrotron Radiation (ISS)/ANKA Light Source, Forschungszentrum Karlsruhe, Postfach 3640, 76021 Karlsruhe (Germany)
- 3. Institute for Microstructure Technology (IMT), Universitaet Karlsruhe, Kaiserstrasse 12, 76131 Karlsruhe (Germany)
Description
Planar X-ray refractive lenses with parabolic surface profile, and in crossed geometry to provide 2D focusing, are fabricated from SU-8 polymer using the LIGA process and deep X-ray lithography technology. A transmission X-ray microscope (TXM) using a condenser and an objective lens based on this type of X-ray optics was set up at the ESRF beamline BM 5, for photon energies of 17.1 and 18 keV. Test structures made of gold and SU-8, with different thicknesses, were imaged with this TXM using in-line phase-contrast, with X-ray magnification factors of 13-20, spatial resolution between 0.2 and 0.3 μm and exposure times around 1 s. The advantages of a TXM based on refractive SU-8 planar crossed condenser and objective and the optimisation of the optical scheme and of the condenser focusing profile are discussed. (copyright 2007 WILEY-VCH Verlag GmbH and Co. KGaA, Weinheim) (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1002/pssa.200675690Additional details
Identifiers
Publishing Information
- Journal Title
- Physica Status Solidi. A, Applied Research
- Journal Volume
- 204
- Journal Issue
- 8
- Journal Page Range
- p. 2811-2816
- ISSN
- 0031-8965
- CODEN
- PSSABA
Conference
- Title
- 8. biennial conference on high resolution X-ray diffraction and imaging
- Acronym
- XTOP 2006
- Dates
- 19-21 Sep 2006
- Place
- Karlsruhe (Germany)
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 38091300
- Subject category
- S46: INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- FOCUSING; HARD X RADIATION; KEV RANGE 10-100; LENSES; MICROSCOPES; OPTICAL MICROSCOPY; OPTICAL SYSTEMS; OPTIMIZATION; POLYMERS; SCANNING ELECTRON MICROSCOPY; SPATIAL RESOLUTION; X-RAY EQUIPMENT; X-RAY RADIOGRAPHY
- Descriptors DEC
- ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; ENERGY RANGE; EQUIPMENT; INDUSTRIAL RADIOGRAPHY; IONIZING RADIATIONS; KEV RANGE; MATERIALS TESTING; MICROSCOPY; NONDESTRUCTIVE TESTING; RADIATIONS; RESOLUTION; TESTING; X RADIATION
Optional Information
- Notes
- With 6 figs., 10 refs.. SICI: 0031-8965(200708)204:8<2811::AID-PSSA200675690>3.0.TX;2-E