Published 1988
| Version v1
Report
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Finite element analysis for calculation of calibration curves for measurement of crack propagation for elliptical surface cracks
Creators
- 1. GKSS-Forschungszentrum Geesthacht G.m.b.H., Geesthacht-Tesperhude (Germany, F.R.). Inst. fuer Anlagentechnik
Description
The finite element method is utilized to calculate the calibration curves for measurement of crack propagation for elliptical surface cracks in fracture mechanics specimens. The calibration curves are required for measurement of the crack propagation using the electrical direct-current method. In this report the calibration curves are calculated for fracture mechanics specimens with the thickness B=5 mm, 10 mm, 15 mm, 18 mm and 20 mm. The starting crack is b0=2 mm for all specimens. (orig.) With 16 figs
Availability note (English)
MF available from INIS under the Report Number.Abstract (German)
Mit der Finite-Element-Methode werden Eichkurven fuer die Messung des Rissfortschrittes von ellipsenfoermigen Oberflaechenrissen in Bruchmechanikproben berechnet. Die Eichkurven sind fuer die Messung des Rissfortschrittes mit der elektrischen Gleichstrom-Potential-Methode erforderlich. In diesem Bericht werden Eichkurven fuer Proben mit den Dicken B=5 mm, 10 mm, 15 mm, 18 mm und 20 mm ermittelt. Die Anrisstiefe betraegt fuer alle Proben b0=2 mm. (orig.) With 16 figs
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Additional details
Additional titles
- Original title (German)
- Finite-Element-Analyse zur Berechnung von Eichkurven fuer die Messung des Rissfortschrittes von ellipsenfoermigen Oberflaechenrissen
Publishing Information
- Imprint Pagination
- 28 p.
- Report number
- GKSS--88/E/34
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 20014926
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- CALIBRATION; CRACK PROPAGATION; CRACKS; ELECTRIC POTENTIAL; FINITE ELEMENT METHOD; FRACTURE MECHANICS; STEELS; SURFACES
- Descriptors DEC
- ALLOYS; CARBON ADDITIONS; IRON ALLOYS; IRON BASE ALLOYS; MECHANICS; NUMERICAL SOLUTION