Published January 1981 | Version v1
Journal article

Study of radiation-induced atom migration in molybdenum-silver and copper-manganese systems by X-ray photoelectron spectroscopy

  • 1. AN Ukrainskoj SSR, Kiev. Inst. Metallofiziki

Description

It is shown that the X-ray photoelectron spectroscopy method is expedient and promising when applied for solving problems of radiation damage physics. Radiation-stimulated migration of atoms of a component of the molybdenum-silver and copper-manganese systems due to the electpon (molybdenum-silver) or gamma-quantum (copper-manganese) is revealed. After irradiation the concentration of the migrating component is found to increase on the surface

Additional details

Additional titles

Original title (Russian)
Исследование радиационно-стимулированной миграции атомов в системах молибден-серебро и медь-марганец методом рентгеновской фотоэлектронной спектроскопии

Publishing Information

Journal Title
Metallofizika
Journal Volume
3
Journal Issue
1
Series
Metallofizika.
Journal Page Range
40-43
ISSN
0368-9662