Design of a Wien filter type heavy ion beam probe system for the measurement of plasma potential

This paper describes the design of a Heavy Ion Beam Probe (HIBP) system to measure the two-dimensional plasma potential profile in the central mirror region of an open ended plasma confinement device (RFC-XX-M). This HIBP system incorporates three novel features. The first is a Wien filter-type guide field that reduces the required beam acceleration voltage. The second is a set of deflecting electrodes located at the exit position of the secondary ion beam that steers all secondary ions into the analyzer at the same angle. And the third is a new method of absolute calibration. (author)