New method for measuring beam profiles using a parametric X-ray pinhole camera

We propose a new method for measuring electron beam profiles using parametric X-ray radiation. In this method, a pinhole is placed between the source of parametric X-ray radiation and a two-dimensional X-ray detector, and the beam profile can be reconstructed on the detector, i.e., based on the principle of a pinhole camera. The profiles are in good agreement with the results obtained using a standard method with optical transition radiation. This method may prove useful to measure profiles of electron beams with short bunch lengths in recent advanced linear accelerators.