Three-wave electron vortex lattices for measuring nanofields
Description
It is demonstrated how an electron-optical arrangement consisting of two electron biprisms can be used to generate three-wave vortex lattices with effective lattice spacings between 0.1 and 1 nm. The presence of vortices in these lattices was verified by using a third biprism to perform direct phase measurements via off-axis electron holography. The use of three-wave lattices for nanoscale electromagnetic field measurements via vortex interferometry is discussed, including the accuracy of vortex position measurements and the interpretation of three-wave vortex lattices in the presence of partial spatial coherence. - Highlights: • We demonstrate how three-wave electron vortex lattices can be generated using two electron biprisms in the TEM. • The optical setup can be used to measure nanoscale electromagnetic fields via vortex interferometry. • The presence of vortices is verified explicitly by using a third biprism to perform phase measurements. • The accuracy of vortex position measurements and the requirements of spatial coherence are discussed
Availability note (English)
Available from http://dx.doi.org/10.1016/j.ultramic.2014.08.011Additional details
Identifiers
- DOI
- 10.1016/j.ultramic.2014.08.011;
- PII
- S0304-3991(14)00161-2;
Publishing Information
- Journal Title
- Ultramicroscopy (Amsterdam)
- Journal Volume
- 148
- Journal Page Range
- p. 25-30
- ISSN
- 0304-3991
- CODEN
- ULTRD6
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 46101051
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ACCURACY; ELECTROMAGNETIC FIELDS; HOLOGRAPHY; INTERFEROMETRY; NANOSTRUCTURES; TRANSMISSION ELECTRON MICROSCOPY
- Descriptors DEC
- ELECTRON MICROSCOPY; MICROSCOPY
Optional Information
- Copyright
- Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.