Published January 2015 | Version v1
Journal article

Three-wave electron vortex lattices for measuring nanofields

Description

It is demonstrated how an electron-optical arrangement consisting of two electron biprisms can be used to generate three-wave vortex lattices with effective lattice spacings between 0.1 and 1 nm. The presence of vortices in these lattices was verified by using a third biprism to perform direct phase measurements via off-axis electron holography. The use of three-wave lattices for nanoscale electromagnetic field measurements via vortex interferometry is discussed, including the accuracy of vortex position measurements and the interpretation of three-wave vortex lattices in the presence of partial spatial coherence. - Highlights: • We demonstrate how three-wave electron vortex lattices can be generated using two electron biprisms in the TEM. • The optical setup can be used to measure nanoscale electromagnetic fields via vortex interferometry. • The presence of vortices is verified explicitly by using a third biprism to perform phase measurements. • The accuracy of vortex position measurements and the requirements of spatial coherence are discussed

Availability note (English)

Available from http://dx.doi.org/10.1016/j.ultramic.2014.08.011

Additional details

Identifiers

DOI
10.1016/j.ultramic.2014.08.011;
PII
S0304-3991(14)00161-2;

Publishing Information

Journal Title
Ultramicroscopy (Amsterdam)
Journal Volume
148
Journal Page Range
p. 25-30
ISSN
0304-3991
CODEN
ULTRD6

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
46101051
Subject category
S36: MATERIALS SCIENCE;
Descriptors DEI
ACCURACY; ELECTROMAGNETIC FIELDS; HOLOGRAPHY; INTERFEROMETRY; NANOSTRUCTURES; TRANSMISSION ELECTRON MICROSCOPY
Descriptors DEC
ELECTRON MICROSCOPY; MICROSCOPY

Optional Information

Copyright
Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.