Photoelectron spectroscopy of some 3d and 4f oxides exposed to Ar+ beams
Creators
- 1. Japan Atomic Energy Research Inst., Tokai, Ibaraki (Japan). Tokai Research Establishment
Description
The effects of the ion bombardment on the surface electronic structures and electrical properties of transition-metal oxides and lanthanide oxides have been investigated by a photoelectron spectroscopy and measurement of surface electric conductivity. Many of the oxides (TiO2, CeO2, etc.) are reduced to the oxides in lower valence states by the 8-keV Ar+-ion bombardment, but there exist some oxides (Sc2O3, La2O3, etc.) which are stable against the bombardment. For TiO2, the bombardment-induced reduction brings about Ti3d-derived new band at the Fermi level, together with the increase of the surface electric conductivity. The mechanism leading to bombardment-induced surface electric conductivity is discussed in relation to the surface electronic structures. (author)
Files
24076518.pdf
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Additional details
Publishing Information
- Imprint Title
- Proceedings of the fourth international symposium on advanced nuclear energy research
- Imprint Pagination
- 676 p.
- Journal Page Range
- p. 359-366.
- Report number
- JAERI-M--92-207
Conference
- Title
- 4. international symposium on advanced nuclear energy research.
- Dates
- 5-7 Feb 1992.
- Place
- Mito (Japan).
INIS
- Country of Publication
- Japan
- Country of Input or Organization
- Japan
- INIS RN
- 24076518
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ARGON IONS; ELECTRIC CONDUCTIVITY; ELECTRONIC STRUCTURE; IRRADIATION; OXIDES; PHOTOELECTRON SPECTROSCOPY; RARE EARTH COMPOUNDS; SPUTTERING; TRANSITION ELEMENTS
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; ELECTRICAL PROPERTIES; ELECTRON SPECTROSCOPY; ELEMENTS; IONS; METALS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; SPECTROSCOPY
Optional Information
- Secondary number(s)
- JAERI-CONF--1.