Published May 2007 | Version v1
Journal article

Average charge of MeV/atom carbon cluster ions impacted on foils

  • 1. Graduate School of Science, Okayama University of Science, 1-1 Ridai-cho, Okayama 700-0005 (Japan) and Department of Applied Physics, Okayama University of Science, 1-1 Ridai-cho, Okayama 700-0005 (Japan)
  • 2. Graduate School of Science, Okayama University of Science, 1-1 Ridai-cho, Okayama 700-0005 (Japan)

Description

The average charges of fragment ions were theoretically studied for 1MeV/atom Cn+(n=1-10) cluster ions penetrating carbon and aluminum foils. Here the clusters are assumed to be in linear-chain structures, and to have a random orientation and to be exploded via coulomb repulsion in a foil. The elastic scattering effect is included, where the screening length in repulsive interaction was proposed. The slowing-down of fragment ions in a solid was taken into account. The calculated results were in good agreement with the recent data

Additional details

Identifiers

DOI
10.1016/j.nimb.2006.12.093;
PII
S0168-583X(06)01372-3;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section B, Beam Interactions with Materials and Atoms
Journal Volume
258
Journal Issue
1
Journal Page Range
p. 57-60
ISSN
0168-583X
CODEN
NIMBEU

Conference

Title
16. international workshop on inelastic ion-surface collisions
Dates
17-22 Sep 2006
Place
Hernstein (Austria)

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
39018374
Subject category
S74: ATOMIC AND MOLECULAR PHYSICS;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ALUMINIUM; ATOMS; CARBON; COULOMB FIELD; ELASTIC SCATTERING; ENERGY LOSSES; FOILS; INELASTIC SCATTERING; INTERACTIONS; ION PAIRS; IONS; LENGTH; MEV RANGE; ORIENTATION; RANDOMNESS; SLOWING-DOWN; SOLIDS
Descriptors DEC
CHARGED PARTICLES; DIMENSIONS; ELECTRIC FIELDS; ELEMENTS; ENERGY RANGE; LOSSES; METALS; NONMETALS; SCATTERING

Optional Information

Copyright
Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.