Published September 2002 | Version v1
Journal article

Experimental study of the plasma fluorination of Y-Ba-Cu-O thin films

  • 1. Nanjing Univ., Nanjing (China). Inst. of Superconductor Electronics, Dept. of Electronic Science and Engineering
  • 2. Nanjing Univ., Nanjing (China). Modern Analysis Center

Description

The authors have experimentally studied the surface modifications of Y-Ba-Cu-O (YBCO) thin films using CF4 plasma. The intensity of the plasma fluorination was controlled by changing the biasing voltage and the time of the plasma treatment. Microstructural analyses reveal that the oxygen content of the YBCO thin films was changed. Transport measurements of sufficient fluorinated YBCO films imply that the films changed totally into an oxygen-deficient semi-conducting state. From these experimental results, the authors believe that plasma fluorination is quite a useful method to form controllable a thin barrier layer in fabricating interface engineered junctions and to form a stable narrow weak-link region in fabricating planar superconductor-normal-superconductor junctions

Additional details

Publishing Information

Journal Title
Chinese Physics Letters
Journal Volume
19
Journal Issue
9
Journal Page Range
p. 1340-1343
ISSN
0256-307X