Published 1977
| Version v1
Journal article
Reactor radiation effect on electric strength of thin film MIM junction
Description
no abstract available
Additional details
Additional titles
- Original title (Russian)
- Влияние реакторного облучения на электрическую прочност' тонкопленочной MDM-системы
Publishing Information
- Journal Title
- Izv. Vyssh. Uchebn. Zaved., Fiz.
- Journal Issue
- no.8
- Series
- Izv. Vyssh. Uchebn. Zaved., Fiz.
INIS
- Country of Publication
- USSR
- Country of Input or Organization
- USSR
- INIS RN
- 9407680
- Subject category
- S36: MATERIALS SCIENCE;
- Resource subtype / Literary indicator
- No Abstract
- Descriptors DEI
- ALUMINIUM; ALUMINIUM NITRIDES; ALUMINIUM OXIDES; ANNEALING; BREAKDOWN; MEDIUM TEMPERATURE; MIM JUNCTIONS; NEUTRON FLUENCE; PHYSICAL RADIATION EFFECTS; TIME DEPENDENCE
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; ELEMENTS; HEAT TREATMENTS; METALS; NITRIDES; NITROGEN COMPOUNDS; OXIDES; OXYGEN COMPOUNDS; RADIATION EFFECTS; SEMICONDUCTOR JUNCTIONS
Optional Information
- Notes
- Published in summary form only; for English translation see the journal Sov. Phys. J.