Published 1997
| Version v1
Miscellaneous
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Accelerator SIMS, a technique for the determination of stable trace elements in ultrapure materials
Creators
- 1. Eidgenoessische Technische Hochschule, Zurich (Switzerland)
- 2. Paul Scherrer Inst. (PSI), Villigen (Switzerland)
Description
A new sputtering chamber with special precautions against sample contamination from the surroundings of the sample has been added to the AMS beamline of the tandem accelerator. This allows the detection of trace element concentrations in ultrapure materials below the ppb range in many cases. (author) 1 fig., 2 refs
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Additional details
Publishing Information
- Publisher
- Paul Scherrer Institut.
- Imprint Place
- Villigen PSI (Switzerland)
- Imprint Title
- Paul Scherrer Institut annual report 1996. Annex IIIA: solid state research at large facilities
- Imprint Pagination
- 180 p.
- Journal Page Range
- p. 41.
- Report number
- INIS-CH--004
INIS
- Country of Publication
- Switzerland
- Country of Input or Organization
- Switzerland
- INIS RN
- 28056399
- Subject category
- S37: INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- ACCELERATORS; ION SPECTROSCOPY; MASS SPECTROSCOPY; MULTI-ELEMENT ANALYSIS; NUMERICAL DATA; SWITZERLAND; TRACE AMOUNTS
- Descriptors DEC
- CHEMICAL ANALYSIS; DATA; DEVELOPED COUNTRIES; EUROPE; INFORMATION; SPECTROSCOPY; WESTERN EUROPE