Advanced materials and device analytical techniques
Description
The analytical approaches discussed in this chapter are categorized into three major areas: volume analysis, energy dispersive spectroscopy and wavelength dispersive spectroscopy, and microelectrical characterization. Electron-beam induced-current and voltage techniques are described. The applications are chosen to illustrate both the utility and the weaknesses of these analytical approaches. The range of analytical tools useful to the solar technologies is expansive. This chapter introduces some of the more utilized (and perhaps more sophisticated) characterization techniques, focusing primarily on those in the compositional, chemical and microelectrical areas. The intent is to provide some understanding of the fundamental principles or physics of each of these methods, their instrumentation, their limitations and their strengths, and the applications to technology development
Additional details
Publishing Information
- Publisher
- Plenum Press.
- Imprint Place
- New York, NY (USA)
- Imprint Title
- Advances in solar energy, Vol. 3
- Journal Page Range
- p. 1-123.
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 18055809
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- AUGER EFFECT; AUGER ELECTRON SPECTROSCOPY; BACKSCATTERING; CARRIER MOBILITY; CHARGE CARRIERS; CHEMICAL COMPOSITION; CHEMICAL SHIFT; COPPER OXIDES; DIFFUSION LENGTH; ELECTRON BEAMS; ENERGY-LOSS SPECTROSCOPY; GALLIUM ARSENIDES; INDIUM PHOSPHIDES; ION MICROPROBE ANALYSIS; MASS SPECTROSCOPY; MATERIALS TESTING; PHOTOELECTRON SPECTROSCOPY; QUANTITATIVE CHEMICAL ANALYSIS; RECOMBINATION; RESOLUTION; RUTHERFORD SCATTERING; SEMICONDUCTOR MATERIALS; SOLAR CELLS; STRUCTURAL CHEMICAL ANALYSIS; X-RAY SPECTROSCOPY
- Descriptors DEC
- ARSENIC COMPOUNDS; ARSENIDES; BEAMS; CHALCOGENIDES; CHEMICAL ANALYSIS; COPPER COMPOUNDS; DIRECT ENERGY CONVERTERS; ELASTIC SCATTERING; ELECTRON SPECTROSCOPY; ELECTRONIC EQUIPMENT; EQUIPMENT; GALLIUM COMPOUNDS; INDIUM COMPOUNDS; LEPTON BEAMS; MATERIALS; MICROANALYSIS; MOBILITY; NONDESTRUCTIVE ANALYSIS; OXIDES; OXYGEN COMPOUNDS; PARTICLE BEAMS; PHOSPHIDES; PHOSPHORUS COMPOUNDS; SCATTERING; SPECTROSCOPY; TESTING; TRANSITION ELEMENT COMPOUNDS