Published July 1, 2018 | Version v1
Journal article

Influence of the technological development on the adhesion increment of metallic thin film coatings to ceramic substrates of aluminum oxide

  • 1. Bauman Moscow State Technical University (Russian Federation)

Description

In this journal are considered that the comparing of the adhesion strength with and without Ti layer between substrate and current layers. Comparing of the DC magnetron and pulse magnetron with various pressure in vacuum chamber. With Ti sub layer adhesion strength 10 times more than without adhesion layers. The best value of adhesion strength was obtained by using with a direct current magnetron and pressure in the chamber 8.8×10−2 mbar. A series of experiments was conducted with differences substrate position and maximum and minimum distance between substrate and target to prevent the destruction of the substrate when coating with a hot cathode target, it is necessary to limit the thermal effect on it. (paper)

Availability note (English)

Available from http://dx.doi.org/10.1088/1757-899X/387/1/012037

Additional details

Publishing Information

Journal Title
IOP Conference Series. Materials Science and Engineering (Online)
Journal Volume
387
Journal Issue
1
Journal Page Range
[5 p.]
ISSN
1757-899X

Conference

Title
25. International Conference on Vacuum Technique and Technology
Dates
5-7 Jun 2018
Place
St. Petersburg (Russian Federation)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
52092300
Subject category
S36: MATERIALS SCIENCE; S42: ENGINEERING;
Resource subtype / Literary indicator
Conference
Descriptors DEI
ADHESION; ALUMINIUM OXIDES; CATHODES; CERAMICS; COATINGS; COMPARATIVE EVALUATIONS; DIRECT CURRENT; LAYERS; MAGNETRONS; PULSES; SUBSTRATES; TEMPERATURE DEPENDENCE; THIN FILMS
Descriptors DEC
ALUMINIUM COMPOUNDS; CHALCOGENIDES; CURRENTS; ELECTRIC CURRENTS; ELECTRODES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; EVALUATION; FILMS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS