Published July 1, 2018
| Version v1
Journal article
Influence of the technological development on the adhesion increment of metallic thin film coatings to ceramic substrates of aluminum oxide
- 1. Bauman Moscow State Technical University (Russian Federation)
Description
In this journal are considered that the comparing of the adhesion strength with and without Ti layer between substrate and current layers. Comparing of the DC magnetron and pulse magnetron with various pressure in vacuum chamber. With Ti sub layer adhesion strength 10 times more than without adhesion layers. The best value of adhesion strength was obtained by using with a direct current magnetron and pressure in the chamber 8.8×10−2 mbar. A series of experiments was conducted with differences substrate position and maximum and minimum distance between substrate and target to prevent the destruction of the substrate when coating with a hot cathode target, it is necessary to limit the thermal effect on it. (paper)
Availability note (English)
Available from http://dx.doi.org/10.1088/1757-899X/387/1/012037Additional details
Identifiers
Publishing Information
- Journal Title
- IOP Conference Series. Materials Science and Engineering (Online)
- Journal Volume
- 387
- Journal Issue
- 1
- Journal Page Range
- [5 p.]
- ISSN
- 1757-899X
Conference
- Title
- 25. International Conference on Vacuum Technique and Technology
- Dates
- 5-7 Jun 2018
- Place
- St. Petersburg (Russian Federation)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 52092300
- Subject category
- S36: MATERIALS SCIENCE; S42: ENGINEERING;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- ADHESION; ALUMINIUM OXIDES; CATHODES; CERAMICS; COATINGS; COMPARATIVE EVALUATIONS; DIRECT CURRENT; LAYERS; MAGNETRONS; PULSES; SUBSTRATES; TEMPERATURE DEPENDENCE; THIN FILMS
- Descriptors DEC
- ALUMINIUM COMPOUNDS; CHALCOGENIDES; CURRENTS; ELECTRIC CURRENTS; ELECTRODES; ELECTRON TUBES; ELECTRONIC EQUIPMENT; EQUIPMENT; EVALUATION; FILMS; MICROWAVE EQUIPMENT; MICROWAVE TUBES; OXIDES; OXYGEN COMPOUNDS