Published June 15, 1978 | Version v1
Journal article Metadata-only

Recovery of X-ray radiation damage in anthracene single crystals

Creators

  • 1. Keio Univ., Yokohama (Japan). Faculty of Engineering

Description

Imperfections are introduced in anthracene single crystals by low energy (<= 20 keV) X-ray irradiation. About 60% of these imperfections can be recovered by annealing. The activation energy for recovery of the structural defects is measured to be 1.12 eV, using triplet excitons as a probe. (Auth.)

Additional details

Identifiers

DOI
10.1016/0009-2614(78)89040-x;

Publishing Information

Journal Title
Chemical Physics Letters
Journal Volume
56
Journal Issue
3
Series
Chem. Phys. Lett.
Journal Page Range
560-562
ISSN
0009-2614

INIS

Country of Publication
Netherlands
Country of Input or Organization
Netherlands
INIS RN
9412945
Subject category
S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Descriptors DEI
ACTIVATION ENERGY; ANNEALING; ANTHRACENE; CRYSTAL DEFECTS; EXCITONS; MONOCRYSTALS; PHYSICAL RADIATION EFFECTS; TIME DEPENDENCE; X RADIATION
Descriptors DEC
AROMATICS; CONDENSED AROMATICS; CRYSTAL STRUCTURE; CRYSTALS; ELECTROMAGNETIC RADIATION; ENERGY; HEAT TREATMENTS; HYDROCARBONS; IONIZING RADIATIONS; ORGANIC COMPOUNDS; QUASI PARTICLES; RADIATION EFFECTS; RADIATIONS

Optional Information

Notes
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