Nonlinear optical absorption in Bi3TiNbO9 thin films using Z-scan technique
- 1. Harbin Institute of Technology, Center for Condensed Matter Science and Technology, Department of Physics, Harbin (China)
- 2. Harbin Institute of Technology, Center for Composite Materials, Harbin (China)
- 3. Hong Kong Baptist University, Department of Physics, Hong Kong SAR (China)
- 4. Pennsylvania State University, Materials Research Institute, University Park, Pennsylvania (United States)
Description
Bi3TiNbO9 (BTN) thin films with layered perovskite structure were fabricated on fused silica by pulsed laser deposition. The XRD pattern revealed that the films are single-phase perovskite and highly (00l) textured. Their fundamental optical constants, such as band gap, linear refractive index, and linear absorption coefficient, were obtained by optical transmittance measurements. The dispersion relation of the refractive index vs. wavelength follows the single electronic oscillator model. The nonlinear optical absorption of the films was investigated by single beam Z-scan method at a wavelength of 800 nm with laser duration of 80 fs. We obtained the nonlinear absorption coefficient β=1.44 x 10-7 m/W. The results show that the BTN thin films are promising for applications in absorbing-type optical devices. (orig.)
Availability note (English)
Available from: http://dx.doi.org/10.1007/s00339-009-5136-zAdditional details
Identifiers
Publishing Information
- Journal Title
- Applied Physics. A, Materials Science and Processing
- Journal Volume
- 96
- Journal Issue
- 4
- Journal Page Range
- p. 1017-1021
- ISSN
- 0947-8396
- CODEN
- APAMFC
INIS
- Country of Publication
- Germany
- Country of Input or Organization
- Germany
- INIS RN
- 40090118
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- ABSORPTION SPECTRA; BAND THEORY; BISMUTH COMPOUNDS; CUBIC LATTICES; DEPOSITION; DISPERSION RELATIONS; ELECTRONIC STRUCTURE; ENERGY GAP; INFRARED SPECTRA; LASER BEAM MACHINING; LASER RADIATION; LAYERS; NIOBATES; NONLINEAR OPTICS; OPACITY; OPTICAL DISPERSION; PULSED IRRADIATION; REFRACTIVE INDEX; SCANNING ELECTRON MICROSCOPY; SILICA; SUBSTRATES; TEXTURE; THIN FILMS; TITANATES; VISIBLE SPECTRA; X-RAY DIFFRACTION
- Descriptors DEC
- COHERENT SCATTERING; CRYSTAL LATTICES; CRYSTAL STRUCTURE; DIFFRACTION; ELECTROMAGNETIC RADIATION; ELECTRON MICROSCOPY; FILMS; IRRADIATION; MACHINING; MICROSCOPY; MINERALS; NIOBIUM COMPOUNDS; OPTICAL PROPERTIES; OPTICS; OXIDE MINERALS; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; RADIATIONS; REFRACTORY METAL COMPOUNDS; SCATTERING; SPECTRA; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS