Published 1989 | Version v1
Report

On the formation of thick and multiple layer SIMOX structures and their applications

  • 1. Spire Corp., Bedford, MA (USA)
  • 2. Rome Air Development Center, Hanscom AFB, MA (USA)

Description

This paper will address the formation of SIMOX structures with thick and multiple buried SiO2 layers by multiple oxygen implantation and growth of epitaxial Si by chemical vapor deposition (CVD). The results indicate that SIMOX material can be produced with a buried layer of any thickness or with any number of distinct buried oxide layers and distinct silicon layers. Thick and double buried SiO2 layer material may be useful for high voltage isolation and electric field shielding. In addition, the authors have demonstrated optical waveguide action in SIMOX wafers. This suggest that in a double buried SiO2 layer system, three dimensional stacked integration of silicon waveguides is possible, including two level optical interconnects. 9 refs., 4 figs

Additional details

Publishing Information

Imprint Title
Ion beam processing of advanced electronic materials
Imprint Pagination
393 p.
Journal Page Range
(Paper 32) p. 6.
Report number
CONF-8904275--

Conference

Title
Symposium on ion beam processing of advanced electronic materials.
Dates
25-27 Apr 1989.
Place
San Diego, CA (USA).