Rare-earth ions doping effects on the optical properties of sol-gel fabricated PbTiO3 thin films
Description
Ce, Sm, Dy, Er and Yb doped PbTiO3 thin films were deposited by sol-gel method on (111)Pt/Ti/SiO2/Si substrates. The optical properties of the films were characterized by means of ellipsometry using a HeNe-laser source (λ=632.8 nm). Real (n) and imaginary (k) parts of the refractive index were obtained applying the Fresnel equation. It is shown that for lead titanate thin films doped with 2 mol.% of lanthanide (Ln) ions the real part of the refractive index decreases smoothly with increasing atomic number of the element, with the exception of the Ce doped film. The experimental results are explained taking into account the electronic structure of the dopants. Specific results of Ce are explained by its oxidation state, which has been shown by means of X-ray photoelectron spectroscopy to be +4. Additionally, noticeable correlation of the optical properties of the films with respect to doping level was observed
Additional details
Identifiers
- DOI
- 10.1016/S0040-6090;
- PII
- S0040609003013075;
Publishing Information
- Journal Title
- Thin Solid Films
- Journal Volume
- 446
- Journal Issue
- 1
- Journal Page Range
- p. 50-53
- ISSN
- 0040-6090
- CODEN
- THSFAP
INIS
- Country of Publication
- Netherlands
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 37013720
- Subject category
- S36: MATERIALS SCIENCE;
- Descriptors DEI
- DOPED MATERIALS; ELECTRONIC STRUCTURE; ELLIPSOMETRY; HELIUM-NEON LASERS; IONS; LEAD COMPOUNDS; REFRACTIVE INDEX; SILICON OXIDES; SOL-GEL PROCESS; THIN FILMS; TITANATES; X-RAY PHOTOELECTRON SPECTROSCOPY
- Descriptors DEC
- CHALCOGENIDES; CHARGED PARTICLES; ELECTRON SPECTROSCOPY; FILMS; GAS LASERS; LASERS; MATERIALS; MEASURING METHODS; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHOTOELECTRON SPECTROSCOPY; PHYSICAL PROPERTIES; SILICON COMPOUNDS; SPECTROSCOPY; TITANIUM COMPOUNDS; TRANSITION ELEMENT COMPOUNDS
Optional Information
- Copyright
- Copyright (c) 2003 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.