Published December 21, 2010 | Version v1
Journal article

Electric field contributions of fast beam injection and ejection systems for particle accelerators

  • 1. High Energy Accelerator Research Organization (KEK), 1-1 Oho, Tsukuba, Ibaraki 305-0801 (Japan)
  • 2. Akita Prefectural University, 84-4 Aza Ebinokuchi, Tsuchiya, Yurihonjo, Akita 015-0055 (Japan)
  • 3. Tohoku Gakuin University, 1-13-1 Chuo, Tagajo, Miyagi 985-8537 (Japan)

Description

The effect of an electric field has been treated as smaller than that of a magnetic field in the control of a high-energy beam orbit, and it has been ignored in the magnets of almost all high-energy particle accelerators. There is currently a strong demand for high-energy accuracy field performance of the order of 1% in pulsed magnets to suppress beam loss at injection/ejection in high-intensity particle accelerators. The effect of the electric field increases as particle energy decreases. The electric field induced in a gap of pulsed magnets is complex as its characteristics vary with time and space. Here, electric field contributions to various kicker magnet systems are summarized.

Availability note (English)

Available from http://dx.doi.org/10.1016/j.nima.2010.09.144

Additional details

Identifiers

DOI
10.1016/j.nima.2010.09.144;
PII
S0168-9002(10)02178-9;

Publishing Information

Journal Title
Nuclear Instruments and Methods in Physics Research. Section A, Accelerators, Spectrometers, Detectors and Associated Equipment
Journal Volume
624
Journal Issue
3
Journal Page Range
p. 554-559
ISSN
0168-9002
CODEN
NIMAER

INIS

Country of Publication
Netherlands
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42074978
Subject category
S43: PARTICLE ACCELERATORS;
Descriptors DEI
ACCURACY; BEAM INJECTION; BEAMS; ELECTRIC FIELDS; HADRONS; INJECTION; KICKER MAGNETS; LOSSES; MAGNETIC FIELDS; PARTICLES; SYNCHROTRONS
Descriptors DEC
ACCELERATORS; CYCLIC ACCELERATORS; ELEMENTARY PARTICLES; EQUIPMENT; INTAKE; MAGNETS

Optional Information

Copyright
Copyright (c) 2010 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.