Published February 1, 2010
| Version v1
Journal article
Theoretical and experimental factors affecting measurements of semiconductor mean inner potentials
- 1. Center for Electron Nanoscopy, Technical University of Denmark, DK-2800 Kongens Lyngby (Denmark)
- 2. Center for Atomic-Scale Materials Design, Technical University of Denmark, DK-2800 Kongens Lyngby (Denmark)
Description
We use density functional theory to explore the effect on calculations of semiconductor mean inner potentials of the presence of reconstructions, changes in lattice spacing and adsorbates on the surfaces of parallel-sided thin specimens. We also use electron holography to illustrate several factors that affect experimental measurements of mean inner potentials of semiconductor nanowires.
Availability note (English)
Available from http://dx.doi.org/10.1088/1742-6596/209/1/012030Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Physics. Conference Series (Online)
- Journal Volume
- 209
- Journal Issue
- 1
- Journal Page Range
- [4 p.]
- ISSN
- 1742-6596
Conference
- Title
- 16. international conference on microscopy of semiconducting materials
- Dates
- 17-20 Mar 2009
- Place
- Oxford (United Kingdom)
INIS
- Country of Publication
- United Kingdom
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 42041323
- Subject category
- S77: NANOSCIENCE AND NANOTECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CRYSTAL LATTICES; DENSITY FUNCTIONAL METHOD; ELECTRONS; HOLOGRAPHY; POTENTIALS; QUANTUM WIRES; SEMICONDUCTOR MATERIALS; SURFACES
- Descriptors DEC
- CALCULATION METHODS; CRYSTAL STRUCTURE; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MATERIALS; NANOSTRUCTURES; VARIATIONAL METHODS