Published February 1, 2010 | Version v1
Journal article

Theoretical and experimental factors affecting measurements of semiconductor mean inner potentials

  • 1. Center for Electron Nanoscopy, Technical University of Denmark, DK-2800 Kongens Lyngby (Denmark)
  • 2. Center for Atomic-Scale Materials Design, Technical University of Denmark, DK-2800 Kongens Lyngby (Denmark)

Description

We use density functional theory to explore the effect on calculations of semiconductor mean inner potentials of the presence of reconstructions, changes in lattice spacing and adsorbates on the surfaces of parallel-sided thin specimens. We also use electron holography to illustrate several factors that affect experimental measurements of mean inner potentials of semiconductor nanowires.

Availability note (English)

Available from http://dx.doi.org/10.1088/1742-6596/209/1/012030

Additional details

Publishing Information

Journal Title
Journal of Physics. Conference Series (Online)
Journal Volume
209
Journal Issue
1
Journal Page Range
[4 p.]
ISSN
1742-6596

Conference

Title
16. international conference on microscopy of semiconducting materials
Dates
17-20 Mar 2009
Place
Oxford (United Kingdom)

INIS

Country of Publication
United Kingdom
Country of Input or Organization
International Atomic Energy Agency (IAEA)
INIS RN
42041323
Subject category
S77: NANOSCIENCE AND NANOTECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
Resource subtype / Literary indicator
Conference
Descriptors DEI
CRYSTAL LATTICES; DENSITY FUNCTIONAL METHOD; ELECTRONS; HOLOGRAPHY; POTENTIALS; QUANTUM WIRES; SEMICONDUCTOR MATERIALS; SURFACES
Descriptors DEC
CALCULATION METHODS; CRYSTAL STRUCTURE; ELEMENTARY PARTICLES; FERMIONS; LEPTONS; MATERIALS; NANOSTRUCTURES; VARIATIONAL METHODS