Theoretical model for thin ferroelectric films and the multilayer structures based on them
- 1. St. Petersburg National Research Univeristy ITMO, Institute of Refrigeration and Biotechnologies (Russian Federation)
- 2. Vienna University of Technology, Institute for Microelectronics (Austria)
Description
A modified Weiss mean-field theory is used to study the dependence of the properties of a thin ferroelectric film on its thickness. The possibility of introducing gradient terms into the thermodynamic potential is analyzed using the calculus of variations. An integral equation is introduced to generalize the well-known Langevin equation to the case of the boundaries of a ferroelectric. An analysis of this equation leads to the existence of a transition layer at the interface between ferroelectrics or a ferroelectric and a dielectric. The permittivity of this layer is shown to depend on the electric field direction even if the ferroelectrics in contact are homogeneous. The results obtained in terms of the Weiss model are compared with the results of the models based on the correlation effect and the presence of a dielectric layer at the boundary of a ferroelectric and with experimental data
Additional details
Identifiers
Publishing Information
- Journal Title
- Journal of Experimental and Theoretical Physics
- Journal Volume
- 116
- Journal Issue
- 6
- Journal Page Range
- p. 987-994
- ISSN
- 1063-7761
- CODEN
- JTPHES
INIS
- Country of Publication
- United States
- Country of Input or Organization
- International Atomic Energy Agency (IAEA)
- INIS RN
- 44078656
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Numerical Data
- Descriptors DEI
- CORRELATIONS; DIELECTRIC MATERIALS; ELECTRIC FIELDS; EXPERIMENTAL DATA; FERROELECTRIC MATERIALS; INTEGRAL EQUATIONS; INTERFACES; LANGEVIN EQUATION; LAYERS; MEAN-FIELD THEORY; PERMITTIVITY; THERMODYNAMIC PROPERTIES; THIN FILMS; VARIATIONAL METHODS
- Descriptors DEC
- CALCULATION METHODS; DATA; DIELECTRIC MATERIALS; DIELECTRIC PROPERTIES; ELECTRICAL PROPERTIES; EQUATIONS; FILMS; INFORMATION; MATERIALS; NUMERICAL DATA; PHYSICAL PROPERTIES
Optional Information
- Copyright
- Copyright (c) 2013 Pleiades Publishing, Ltd.
- Notes
- http://www.springer-ny.com