Published 2000
| Version v1
Journal article
Trends in Plasma Processing for Ultra Large Scale Integration Technology
Creators
- 1. Laboratorie Des Technologies de la Microelectronique CNRS EP 2073, Grenoble (France)
- 2. France Telecom, Branche Development CNET-CNS, Meylan (France)
- 3. Semicroelectronics, 38926, Crolles (France)
- 4. LETI, CEA Technologies Avancees, Grenoble (France)
Description
A review of plasma processes involved in silicon device fabrication is presented in this paper. An example of plasma-assisted deposition processes for oxynitride thin film elaboration is presented in the first part of the paper. In the second part of the paper, silicon and dielectric etch processes are discussed and emphasis is put on the key issues which need to be solved in the near future. In the last part of the paper, the applications of plasma processes for advanced lithography techniques will also be discussed. (author)
Additional details
Publishing Information
- Journal Title
- Journal of Technical Physics
- Journal Volume
- 41
- Journal Issue
- 1
- Journal Page Range
- p. 35-50
- ISSN
- 0324-8313
Conference
- Title
- International Conference on Phenomena in Ionized Gases
- Dates
- 11-16 Jul 1999
- Place
- Warsaw (Poland)
INIS
- Country of Publication
- Poland
- Country of Input or Organization
- Poland
- INIS RN
- 31064483
- Subject category
- S70: PLASMA PHYSICS AND FUSION TECHNOLOGY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- CHEMICAL VAPOR DEPOSITION; DIELECTRIC MATERIALS; ETCHING; INTEGRATED CIRCUITS; MEETINGS; MEMORY DEVICES; MICROELECTRONIC CIRCUITS; NITRIDES; OXIDATION; OXYGEN COMPOUNDS; PLASMA; REFRACTIVE INDEX; SEMICONDUCTOR DEVICES; SILICON; SILICON OXIDES; SURFACE TREATMENTS; TECHNOLOGY IMPACTS; THIN FILM STORAGE DEVICES; THIN FILMS
- Descriptors DEC
- CHALCOGENIDES; CHEMICAL COATING; CHEMICAL REACTIONS; DEPOSITION; ELECTRONIC CIRCUITS; ELEMENTS; FILMS; MATERIALS; MEMORY DEVICES; MICROELECTRONIC CIRCUITS; NITROGEN COMPOUNDS; OPTICAL PROPERTIES; OXIDES; OXYGEN COMPOUNDS; PHYSICAL PROPERTIES; PNICTIDES; SEMIMETALS; SILICON COMPOUNDS; SURFACE COATING; SURFACE FINISHING
Optional Information
- Notes
- 37 refs, 10 figs, 1 tab