A new quantum flux parametron logic gate with large input margin
Creators
- 1. Goto Quantum Magneto Flux Logic Project, Research Development Corp. of Japan, 1-280 Higashi-Koigakubo, Kokubunji-shi, Tokyo 185 (Japan)
Description
This paper reports on the Quantum Flux Parametron (QFP) which is a flux transfer, flux activated Josephson logic device which realizes much lower power dissipation than other Josephson logic devices. Being a two-terminal device its correct operation may be affected by coupling to other QFPs. The problems include backcoupling from active QFPs through inactive QFPs (relay noise), coupling between QFPs activated at different times because of clock skew (homophase noise), and interaction between active QFPs (reaction hazard). Previous QFP circuits worked by wired-majority, which being a linear input logic, has low input margin. A new logic gate (D-gate) using a QFP to perform logic operations has been analyzed and tested by computer simulation. Relay noise, homophase noise and reaction hazard are substantially reduced. Moreover, the input have little interaction hence input margin is greatly improved
Additional details
Publishing Information
- Journal Title
- IEEE Transactions on Magnetics
- Journal Volume
- 27
- Journal Issue
- 2
- Series
- IEEE Trans. Magn.
- Journal Page Range
- 2765-2768
- ISSN
- 0018-9464
- CODEN
- IEMGA
Conference
- Title
- 1990 applied superconductivity conference.
- Dates
- 24-28 Sep 1990.
- Place
- Snowmass, CO (United States).
INIS
- Country of Publication
- United States
- Country of Input or Organization
- United States
- INIS RN
- 23021008
- Subject category
- S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; S75: CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY;
- Resource subtype / Literary indicator
- Conference
- Descriptors DEI
- COMPUTERIZED SIMULATION; COUPLING; DESIGN; INTEGRATED CIRCUITS; JOSEPHSON JUNCTIONS; MAGNETIC FLUX; SUPERCONDUCTIVITY
- Descriptors DEC
- ELECTRIC CONDUCTIVITY; ELECTRICAL PROPERTIES; ELECTRONIC CIRCUITS; PHYSICAL PROPERTIES; SEMICONDUCTOR JUNCTIONS; SIMULATION
Optional Information
- Secondary number(s)
- CONF-900944--.