Studies on characterization of (U,Th)O2 solid samples by total reflection x-ray fluorescence spectrometry without dissolution

Studies have been made for the development of a total reflection x-ray fluorescence (TXRF) method of characterization of sintered and unsintered (U,Th)O2 solid solutions in different forms like pellets, powder and microspheres without dissolution. Uranium determinations from TXRF spectra of such samples were made with respect to thorium assuming it as an internal standard. Samples having uranium atom percent from 0-100% were analyzed for uranium by TXRF and the results showed a precision and accuracy better than 6% in most of the cases. The TXRF method is more sensitive than the Vegards Law method for estimation of uranium in (U,Th)O2 solid solutions. (author)