Development of the temperature measurement device for the positive ion insensitive to the probe contamination

The contamination effect to the d.c. probe in the plasma diagnostics is quite serious in the low density plasma. It causes the distortion or hysterisis curves on the probe characteristics. In order to escape it, for the Langmuir probe measurements, methods of high speed sweeping of probe voltage and using the cleaned probe are reported. In this paper, we dealed with the results of experimental examinations of the possibilities and the limitation of the application of above sweeping to the ion temperature measurement. The essential difficulties of the ion parameter measurements to the d.c. probe of the electrons that very small signal currents and the strong capacitance of the electrodes makes the large time constant, is solved by the use of the neutralization circuits. By this neutralization, high speed voltage sweeping can be possible, and high time resolution of the parameters can be obtained. Using this merits, when the probe is boarded on the space craft, this high space resolution of this probe has additive merits about the possibilities of the aspect measurements of plasma flow and the probe. It is concluded that the high scan rate ion trap is useful of the space craft to the erronious probing by the use of uncleaned probe. (author)